FISCHERSCOPE® X-RAY Product Line X-Ray Fluorescence Measuring Instruments for the Measurement of Coating Thickness and Material Analysis Coating Thickness jjj] Material Analysis Microhardness | | Material Testing

Coating Thickness Material Analysis X-RAY Product Overview

Knowledge, Competence and Experience you can rely on Since 1953, FISCHER has developed and produced innovative measuring technologies for the measurement of coating thickness, materials analysis, micro-hardness measurement and materials testing. Measuring technology from FISCHER is currently employed all around the world – wherever accuracy, precision and reliability are required. As one of the pioneers in using X-ray fluorescence for industrial measurement, FISCHER quickly recognised the tremendous potential of this method for measuring coating thickness and began developing and manufacturing...

X-ray fluorescence analysis (XRFA) The Energy Dispersive X-Ray Fluorescence Analysis (ED-XRFA) is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. In both laboratory and industrial environments, this method is now well established and can be readily utilised with modern equipment. ED-XRFA is a very universal method offering some outstanding advantages. It covers virtually all technically relevant...

The Principle X-ray fluorescence analysis has its basis in the phenomenon that, when atoms in a material sample are excited by the primary X-radiation, electrons from the innermost shells are released; the resultant vacancies are then filled by electrons from the outer shells. During these transitions, fluorescent radiation is generated that is characteristic for each element. This is read by the detector and provides information on the composition of the sample. Applications Because ED-XRFA is capable of determining the composition of materials and measuring thin coatings and coating systems,...

FISCHERSCOPE® X-RAY Measurement Systems X-ray tube Measurement result Primary filter Shutter Video camera Aperture (Collimator) X-ray primary radiation Detector Measurement spectrum Fluorescence radiation Sample Coatings Base material Proportional counter tube X-RAY Product Overview

It takes ingenuity and solid, continuous development to create robust and high-precision X-ray measuring instruments that work reliably in both laboratory and everyday industrial settings. We at FISCHER have committed ourselves passionately to this mission, which is reflected in the wide variety of FISCHERSCOPE X-RAY instruments we produce. Radiation source The primary X-radiation required for X-ray fluorescence analysis is generated using an X-ray tube in which a heated cathode emits electrons which are accelerated to a very high speed by applying high voltage. For example, systems with X-ray...

FISCHERSCOPE® X-RAY Measurement Systems Shutter The shutter is located directly in the beam path and is opened only for the duration of the measurement. In its closed state, it prevents the primary radiation from entering the measuring chamber. Monitored by the safety system, it opens only when the housing is completely closed, eliminating the risk of radiation for the operator. Proportional counter tube (PC) • Large area sensitive to radiation, allowing for high count rates even with very small measurement spots Energy resolution (FWHM) ∆E/E approx. 8%. • Cost-effective • Typically used for...

Sample support and stages Whether for quickly placing and measuring a sample or for performing automatic measurements of complex components, FISCHERSCOPE X-RAY measurement systems are furnished with appropriate sample supports, ranging from simple, plane probe supports or manually operable XY-stages through to high-precision, programmable XY-stages. Positioning aids Simple and fast sample positioning saves time and money. For this reason, all instruments with an XY-stage feature a laser pointer as a positioning aid, which greatly streamlines the localisation of the measurement spot. Stops, rulers...

WinFTM® Software Here, FISCHER leads the way, implementing in WinFTM numerically effective algorithms that are based on a lifelike physical model. For this reason, all measurements can also be carried out standard-free. But WinFTM is more. It is also the command centre for user-friendly operation and optimal employment of the FISCHERSCOPE X-RAY measuring instruments, not only in the laboratory but also in daily industrial use. Scope of applications From simple coating thickness measurements in the electroplating industry, such as zinc on iron, to bath analyses, complex multi-coating applications,...

For this reason, FISCHER has designed the WinFTM Software such that no particular training is required for routine measurement operations. Based on the wellknown Windows standard, its intuitive user interface and predefined, automated processes and command buttons make the job easy. All functions are quickly accessible and displayed only if they are actually needed, ensuring that the screen is always clearly arranged and uncluttered. Solid physical foundation WinFTM employs an algorithm based on fundamental parameters in order to determine composition of alloys, as well as thickness and composition...

WinFTM® Software Substrate Material Recognition For certain coating thickness measurements, WinFTM can automatically analyse the substrate material as well. This not only eliminates the need for normalisation when taking measurements on different materials, it also increases the reliability of the results because the coating thickness is correctly measured despite eventual fluctuations in substrate material composition. Classes of Materials (COM) Using the COM function, unknown samples can be assigned automatically to a predefined material class. These classes may be different kinds of materials,...