Photovoltaic thin film characterization with FISCHER X-Ray spectrometers

Product catalog summary

Introduction
The document introduces Helmut Fischer GmbH, a company specializing in electronics and measurement technology, particularly in coating thickness, material testing, microhardness, and material analysis. Their products are designed for the photovoltaic (pv) industry, focusing on the characterization of coatings.

Product Overview
The FISCHERSCOPE® X-RAY XDV®-SD and X-RAY Conti 5000 are highlighted as key products. These x-ray spectrometers are essential for analyzing coatings in pv cell production, including materials like CIGS, CdTe, CIS, CISSe, ITO, and TCO.

FISCHERSCOPE X-RAY XDV-SD
This bench-top analyzer is ideal for research, process qualification, and quality control. It is designed to meet the specific requirements of these areas, providing precise and reliable results.

X-RAY Conti 5000
Designed for industrial production, the Conti 5000 in-line x-ray spectrometers offer long-term stability and robustness. They are suitable for continuous operation in production environments, capable of analyzing thin film coatings and layer systems for composition and thickness on various substrates. These instruments can operate under ambient air or in vacuum conditions, with surface temperatures up to 500°C (937°F).

Conclusion
FISCHERSCOPE® X-Ray spectrometers are presented as the solution for pv thin film characterization, emphasizing their precision and suitability for industrial applications.

Catalog excerpts

Photovoltaic thin film characterization with FISCHER X-Ray spectrometers-1

The FISCHERSCOPE® X-RAY XDV®-SD and X-RAY Conti 5000 PV thin film characterization? FISCHERSCOPE® X-Ray spectrometers. For pv cells production the key to success is the perfect characterization of coatings. If it is CIGS, CdTe, CIS or CISSe, ITO or TCO – FISCHERSCOPE X-Ray spectrometers are prepared to do the job. Innovative products for the pv industry from the x-ray experts for coating and material analyzis. The FISCHERSCOPE X-RAY XDV-SD bench-top analyzer is best suited for the requirements of research, process qualification and quality control. For industrial production needs our Conti 5000 in-line x-ray spectrometers are the right solution. These instruments, with outstanding long-term stability, are precise, robust and designed for continuous operation in a production environment. They analyze thin film coatings and layer systems for composition and thickness on various substrates with surface temperatures of up to 500°C (937°F) under ambient air or in vacuum. Helmut Fischer GmbH Institut für Elektronik und Messtechnik, 71069 Sindelfingen, Germany, www.helmut-fischer.com Coating Thickness Material Analysis Microhardness Material Testing

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