Catalog excerpts
FISCHERSCOPE® X-RAY XDV®-SDD MEASUREMENT FROM TOP TO BOTTOM The FISCHERSCOPE X-RAY XDV-SDD features a silicon drift detector with a large sensitive area and good energy resolution. When combined with large apertures, very high count rates can be realised, producing excellent repeatability precision and very low detection limits. The XDV-SDD is particularly well suited for measuring the thinnest of coatings for trace analysis. The improved sensitivity for X-radiation with low energy also expands the range of measurable elements down to lower atomic numbers, enabling, for example, the reliable measurement of phosphorous or aluminium in air. With its large and easily accessible measurement chamber, the XDV-SDD can accommodate flat, plane objects as well as larger specimens with complex shapes. Serial tests or measurements of coating thickness and element distribution are made simple with the fast, programmable XY-stage. User-friendly operation, a wide-opening hood and control elements located on the front of the device facilitate the day-to-day use of this instrument. In order to create ideal excitation conditions for every measurement, the XDV-SDD features exchangeable apertures and primary filters. Hazardous substances in metals: Pb, Cd in Al-alloy X-RAY Product Overview
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The precise definition of the measurement location is simplified by a high-resolution, high magnification video camera, which accurately displays the measurement position during operation. A laser pointer acting as a positioning aid further facilitates the quick orientation of the samples. Its performance capabilities and universal design make the XDV-SDD ideal for research and development, process qualifying, and laboratories. It is also indispensible in quality assurance and in production monitoring, due to its robust design and user-friendliness. Examples from practical applications...
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