FISCHERSCOPE ® X-RAY SERIES X-ray fluorescence for coating thickness measurement and material analysis

X-ray fluorescence analysis 4 - 5 WinFTM® - User-friendliness first 6 - 7 A brief explanation: Anatomy of the X-ray instrument 8 - 9 X-RAY XUL® / XULM® 10 - 11 X-RAY XDL® / XDLM® 16 - 17 X-RAY XDV®-m / XDV®-m LD 22 - 23 Is it real gold? Authenticating jewelry and precious metals 26 - 27 Measurement technology for electronics and semiconductors 30 - 31 X-RAY XULM® PCB / XDLM® PCB / XDV®-p PCB 32 - 33 X-RAY XDV®-m LEAD FRAME 34 - 35 X-RAY XDV®-m Wafer 36 - 37 FISCHERSCOPE® X-RAY in the line 40 - 41 Is there a standard way to measure? 42 - 43 A reliable partner - for the entire life of your instrument...

We help you focus on what really matters – your products. Sometimes, the smallest details determine success. As structures shrink but the demands on them grow, rigorous quality control takes on a whole new level of importance. Whether for coating thickness measurement or material analysis, Fischer is your partner of choice for precise and absolutely reliable measurement technology. With our X-ray systems, we offer highly efficient solutions to make your work as easy as possible. Measuring Made Easy ®

X-ray fluorescence analysis: The standard for countless requirements X-ray fluorescence analysis is not only firmly established in the laboratory but is also commonly used for everyday tasks in industry. It’s clean, non-contact, non-destructive and fast. And it works for all elements of technical relevance. The method is based on the phenomenon that atoms, when excited by primary X-rays, release energy in the form of element-specific fluorescence radiation. The spectrum of the emitted radiation provides information about the makeup of the sample. This enables both analysis of the material composition...

WinFTM ® – User-friendliness first The WinFTM ® software is the mathematical heart of all FISCHERSCOPE ® X-RAY instruments. It takes the data from the measured X-ray spectra and converts it into parameters for layer thickness measurement and material analysis. And Fischer offers many extras. Whether it’s for incoming goods inspections, quality control or research in the lab – for a diverse range of measurement technology demands, the Fischerscope X-RAY devices and the software that drives them are up to the task: WinFTM  provides just the applications and ® functions you need for efficient evaluation...

Simply precise: With standardfree fundamental parameter analysis, you can start measuring without time-consuming instrument calibration.

A brief explanation: Anatomy of the X-Ray instrument X-RAY TUBE generates the X-ray beam SHUTTER opens / closes µm PRIMARY FILTER optimizes excitation radiation MIRROR directs picture to the camera COLLIMATOR/APERTURE the opening that defines the measuring spot COATING MATERIAL BASE MATERIAL

X-ray tube: Generates the primary X-ray radiation. More advanced models have a high-resolution microfocus tube. Devices thus equipped allow for smaller measuring spots. Shutter: Integrated into the beam path, the shutter is a safety device that keeps the primary radiation from entering the measuring chamber. The system is unlocked only for the duration of the measurement, and only when the lid is closed. This prevents the risk of harm to the operator. Collimator/Aperture: Restricts the diameter of the primary beam, ensuring that a measuring spot of defined size is excited. With smaller collimators...

FISCHERSCOPE® X-RAY XUL® / XULM® The robust devices of the FISCHERSCOPE ® X-RAY XUL ® and XULM ® series are designed for smooth and intuitive handling. Although they’re compact, they offer plenty of space – for samples up to 17 cm in height. A recess in the housing (C-slot) allows for measurements on larger flat samples, e.g. overhanging printed circuit

Entry-level models with a focus on speed The instruments of the FISCHERSCOPE ® X-RAY XUL ® and XULM ® series are the right solution for fast determination of coating thickness in electroplating, where a large number of samples must pass through quality control as swiftly as possible. Connectors, contacts, wires and PCBs are the domain of the FISCHERSCOPE ® X-RAY XULM ® series. Because of its microfocus tube, measuring spot sizes of just 0.1 mm are possible. For this reason, the XUL series is designed to enable bulky samples to be positioned manually in the measurement chamber. An optionally available...

Like the FISCHERSCOPE ® X-RAY XUL ® series, the XAN ® instruments are designed primarily for samples with simple geometries. Though, the XAN series is highly adaptable to meet your requirements for specific application tasks. This includes detector, aperture and filter option

Noble metal inspection The system for a wide range of applications The different models of the FISCHERSCOPE ® X-RAY XAN ® series cover a wide range of applications. The focus is on fast and precise material analysis of precious metals and gold alloys. These devices excel in the determination of heavy-metal trace elements and other hazardous substances within the scope of the RoHS Directive. This is particularly important for electronics and other manufacturing industries. The XAN ® 215 is a device with a cost-effective PIN detector. It’s suitable for analyzing simple gold alloys that contain...

The FISCHERSCOPE ® X-RAY XAN ® 500 is the most versatile X-ray fluorescence system available in the market. As a handheld device, it is perfect for inspecting coatings on bulky parts like airplane parts, pipes or turbine blades in a running production line. In addition, the XAN ® 500 can do more than just measure on large parts. With the optionally available measurement box, the device can be transformed into a desktop instrument in just a few simple steps.

Corrosion protection in aircraft construction The specialist for field duty Despite its small size, the FISCHERSCOPE  X-RAY XAN  ® ® 500 is in no way second to laboratory equipment. The modern silicon drift detector is capable of accurate and precise measurement results even with short measuring times. Even complex measuring tasks involving multiple layers are performed reliably – and quickly. How? The clever little device detects thickness and composition of the layer in a single measurement step. Universal hand-held instrument for precise coating thickness measurement and material analysis...