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ODPL measurement system C15993-01
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ODPL measurement system C15993-01

ODPL measurement system C15993-01
1 /3Pages

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ODPL measurement system C15993-01-1

ODPL measurement system

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ODPL measurement system C15993-01-2

ODPL measurement system Easy and instant measurement of IQE (internal quantum efficiency), which is necessary to evaluate GaN single crystals and perovskite crystals Measurement / Analysis Items The ODPL measurement system uses an integrating sphere to measure the spectrum of omnidirectional photoluminescence and determine the emission efficiency of samples. This process is measurement ratio measurement non-destructive and non-contact, and can instantly calculate IQE calculation spectrum measurement (internal quantum efficiency). IQE is necessary for quality evaluation (Simultaneous measurement...

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ODPL measurement system C15993-01-3

300 nm to 950 nm BT-CCD linear image sensor 200 nm to 950 nm < 2 nm 1024 ch -15 °C 16 bit Czerny-Turner type Spectralon 3.3 inch Substrate(6 mm × 6 mm × 1 mm to 17 mm × 17 mm × 1 mm) A10095-01 or A10095-03 can be mounted. White LED Color CMOS camera Approx.ϕ6 mm EQE measurement IQE calculation Absorption ratio measurement PL spectrum measurement 725 mm(W) × 417 mm(H) × 380 mm(D) / Approx. 39.5 kg Options ■ Measurement filters without caps (5 pieces) A10095-01 with caps (5 pieces) A10095-03 This is a set of ND filters(10 %, 2 %, 1 %)for measuring EQE. Calibration data is included. ● Measurement...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.