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ODPL measurement system C15993-01

ODPL measurement system C15993-01

Product catalog summary

Overview of ODPL Measurement System:
The ODPL (Omnidirectional Photoluminescence) measurement system is designed for non-destructive and non-contact evaluation of internal quantum efficiency (IQE) in semiconductor materials, particularly GaN single crystals and perovskite crystals. This system uses an integrating sphere to measure the spectrum of photoluminescence and determine emission efficiency.

Key Specifications:

Measurement range: 300 nm to 950 nm
Weight: Approx. 39.5 kg
Includes a BT-CCD linear image sensor and a color CMOS camera
Measurement filters available for dimming and laser excitation

Measurement Process:
The system calculates IQE by analyzing the emission and absorption of photons. It considers factors like light extraction efficiency and photon recycling. The system can instantly calculate IQE from EQE (external quantum efficiency) measurements.

Applications and Importance:
IQE is a critical parameter for assessing the quality of semiconductor materials, as it reflects the efficiency of light emission. It is sensitive to dislocations, defects, and dopants, making it a valuable indicator of material quality. The ODPL system is particularly useful for evaluating materials used in power devices and solar power generation.

Measurement Examples:

Perovskite materials: Achieved an IQE of at least 62.5%, with variations depending on methylammonium ion concentration.
GaN crystals: Used for power device materials due to their high emission efficiency.

Additional Features:

Includes options for measurement filters and sample cases.
Calibration data is provided with measurement filters.

Contact Information:
Hamamatsu Photonics provides global support with offices in the USA, Germany, France, UK, North Europe, Italy, China, and Taiwan. For more information, visit their website at www.hamamatsu.com.

Catalog excerpts

ODPL measurement system

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ODPL measurement system Easy and instant measurement of IQE (internal quantum efficiency), which is necessary to evaluate GaN single crystals and perovskite crystals Measurement / Analysis Items The ODPL measurement system uses an integrating sphere to measure the spectrum of omnidirectional photoluminescence and determine the emission efficiency of samples. This process is measurement ratio measurement non-destructive and non-contact, and can instantly calculate IQE calculation spectrum measurement (internal quantum efficiency). IQE is necessary for quality evaluation (Simultaneous measurement...

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300 nm to 950 nm BT-CCD linear image sensor 200 nm to 950 nm < 2 nm 1024 ch -15 °C 16 bit Czerny-Turner type Spectralon 3.3 inch Substrate(6 mm × 6 mm × 1 mm to 17 mm × 17 mm × 1 mm) A10095-01 or A10095-03 can be mounted. White LED Color CMOS camera Approx.ϕ6 mm EQE measurement IQE calculation Absorption ratio measurement PL spectrum measurement 725 mm(W) × 417 mm(H) × 380 mm(D) / Approx. 39.5 kg Options ■ Measurement filters without caps (5 pieces) A10095-01 with caps (5 pieces) A10095-03 This is a set of ND filters(10 %, 2 %, 1 %)for measuring EQE. Calibration data is included. ● Measurement...

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ODPL measurement system C15993-01

ODPL measurement system C15993-01

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