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CMOS area image sensor S14501

CMOS area image sensor S14501
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CMOS area image sensor S14501

Product catalog summary
Overview: The S14501 is a back-illuminated APS type CMOS area image sensor with high sensitivity from visible to near-infrared light. It features an SXGA pixel format (1280 × 1024 pixels) and supports imaging at up to 146 frames per second. The sensor includes a built-in timing generator, bias generator, amplifiers, and A/D converters, with options for rolling or global shutter readout.
Specifications:
  • Image size: 9.472 × 7.578 mm
  • Pixel size: 7.4 × 7.4 μm
  • Total pixels: 1280 × 1064
  • Effective pixels: 1280 × 1024
  • Package: Ceramic with borosilicate glass window
Features:
  • High-speed readout up to 146 frames/s
  • SPI communication for partial readout and gain switching
  • Rolling/global shutter readout options
Applications: Suitable for machine vision, tracking, security (infrared cameras), and infrared light spot recognition.
Absolute Maximum Ratings:
  • Supply voltage: -0.3 to +3.9 V for analog, digital, and counter terminals
  • Operating temperature: -40 to +60 °C
  • Storage temperature: -40 to +60 °C
  • Soldering temperature: 260 °C (5 s, 3 times)
Recommended Operating Conditions:
  • Master clock pulse frequency: 25 to 35 MHz
  • Supply voltage: 3.0 to 3.6 V for analog and digital terminals
  • Counter terminal voltage: 2.4 to 3.6 V
Electrical Characteristics:
  • Resolution: 10-bit in high-speed mode, 12-bit in high-resolution mode
  • Spectral response range: 400 to 1100 nm
  • Peak sensitivity wavelength: 660 nm
Performance Parameters:
  • Photosensitivity: Up to 144000 DN/lx∙s in high-speed mode
  • Dynamic range: Up to 66 dB in high-speed mode
  • Conversion factor: 37 μV/e- in rolling shutter mode
Additional Features: The sensor supports various settings via SPI, including shutter mode, frame start mode, integration time, blanking period, readout region, output gain, and output offset.
Pin Connections: The sensor has 88 pins with various functions, including LVDS outputs for pixel data, ground connections, supply voltages, and SPI signals. Specific pins are designated for digital, analog, and counter supply voltages, as well as bias voltages for amplifiers and A/D converters.
Recommended Baking and Soldering Conditions: The product supports lead-free soldering and should be stored at temperatures below 30°C and humidity below 60%. Soldering should be completed within 72 hours of unpacking. The document outlines specific temperature and time conditions for preheat, soldering, and peak temperature during reflow soldering.
Precautions: Electrostatic countermeasures are necessary to prevent device damage. The input window should be cleaned carefully to avoid static electricity. The product is not designed to resist UV light, and cleaning solutions should not be used as they may enter the package.
Connection Circuit Example: An example circuit is provided, showing connections for digital buffers, LVDS drivers, and supply voltages. Specific capacitors and diodes are recommended for noise reduction and voltage stabilization.
Disclaimer: The document includes a disclaimer about potential inaccuracies and advises contacting the manufacturer for the latest specifications. The product warranty is valid for one year, limited to repair or replacement for defects reported within that period.
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Catalog excerpts

CMOS area image sensor S14501-1

CMOS area image sensor S14501 Visible/near infrared high sensitivity, back-illuminated APS (active pixel sensor) type The S14501 is a back-illuminated APS type CMOS area image sensor that has high sensitivity in the visible to near infrared region. The pixel format is SXGA (1280 × 1024 pixels). In addition, imaging is possible at a maximum rate of 146 frames/s. It is an all-digital I/O type with built-in timing generator, bias generator, amplifiers, and A/D converters. Rolling shutter readout or global shutter readout can be selected. Since the number of readout pixels in the vertical direction can be changed as you like, high-speed readout is possible according to the number of pixels. Machine vision Number of pixels: 1280 × 1024 (SXGA) High-speed readout: 146 frames/s max. Security (infrared camera) SPI communication function (partial readout, gain switching, frame start mode selection, etc.) Position and shape recognition of infrared light spot Rolling/global shutter readout Structure Parameter Image size (H × V) Pixel size Pixel pitch Total number of pixels (H × V) Number of effective pixels (H × V) Boundary pixels*1 Guard pixels*2 Light-shielding pixels*3 Package Window material Specification 9.472 × 7.578 7.4 × 7.4 7.4 1280 × 1064 1280 × 1024 Top 4 and bottom 4 rows outside the effective pixel area Rows 4 and 1037 Rows 1 to 3 and rows 1038 to 1064 Ceramic Borosilicate glass Unit mm μm μm pixels pixels - *1: Same pixels as the effective pixels *2: Pixels with a fixed photodiode potential *3: Pixels whose photodiode is shielded with metal

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CMOS area image sensor S14501-2

CMOS area image sensor Pixel layout Light-shielding pixels Guard pixels Boundary pixels Effective pixels Vertical scan direction Horizontal scan direction KMPDC0803EA Absolute maximum ratings (Ta=25 °C) Parameter Symbol Condition Analog terminal Vdd(A) Supply voltage Digital terminal Vdd(D) Counter terminal Vdd(C) Digital input signal terminal voltage*4 Vi Vref_cp1 terminal voltage*5 Vref_cp1 Vref_cp2 terminal voltage*6 Vref_cp2 Operating temperature Topr No dew condensation*7 Storage temperature Tstg No dew condensation*7 8 Soldering temperature* Tsol *4: SPI_CS, SPI_SCLK, SPI_MOSI, SPI_RSTB,...

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CMOS area image sensor S14501-3

CMOS area image sensor Recommended operating conditions (Ta=25 °C) Input voltage Parameter Analog terminal Digital terminal Supply voltage Counter terminal High level 9 Digital input voltage* Low level Vref_cp2 terminal voltage Symbol Vdd(A) Vdd(D) Vdd(C) Vi(H) Vi(L) Vref_cp2 *9: SPI_CS, SPI_SCLK, SPI_MOSI, SPI_RSTB, MCLK, TG_reset, PLL_reset, MST Digital input signal [Recommended operating conditions (input voltage) Typ. value] Parameter Master clock pulse frequency Master clock pulse duty cycle SPI clock pulse frequency Rise time*10 *11 Fall time*10 *11 Symbol f(MCLK) D(MCLK) f(SPI_SCLK) tr(sigi)...

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CMOS area image sensor S14501-4

CMOS area image sensor Electrical characteristics [Ta=25 °C, recommended operating conditions (input voltage, digital input signal) Typ. value (P.3)] Digital output signal Parameter Data rate (per port) Pixel sync signal (pclk) frequency Offset Digital output voltage (LVDS output)*13 *14 Differential Rise time (LVDS output)*13 *14 *15 Fall time (LVDS output)*13 *14 *15 Delay between pixel output sync signal and video output Delay between pixel output sync Rise time signal and line sync signal Fall time Delay between pixel output sync Rise time signal and frame sync signal Fall time Rise time Delay...

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CMOS area image sensor S14501-5

CMOS area image sensor Current consumption Parameter Total of analog terminal and digital terminal*18 Counter terminal*18 *18: Dark state, master clock pulse frequency=30 MHz, high-speed mode, load capacitance of each output terminal= 5 pF A/D converter High resolution mode (SPI value: DAC_N=3, TG_N=19) Parameter Resolution Conversion frequency A/D resolution Symbol Reso fcon - High-speed mode (SPI setting: DAC_N=0, TG_N=3) Parameter Resolution Conversion frequency A/D resolution Symbol Reso fcon - Electrical and optical characteristics [Ta=25 °C, recommended operating conditions (input voltage,...

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CMOS area image sensor S14501-6

CMOS area image sensor High resolution mode Global shutter mode Parameter Offset output*23 Offset variation*24 Dark output*23 Saturation exposure*25 Photosensitivity*25 Saturation output*26 Random noise*23 Dynamic range*27 Conversion factor Symbol Voffset DSNU DS Lsat Sw Vsat RN Drange Unit DN DN rms DN/s lx∙s DN/lx∙s DN DN rms dB μV/eDN/e- Rolling shutter mode Parameter Conversion factor Average output of all pixels excluding boundary pixels, guard pixels, and defective pixels under light-shielded condition Standard deviation of output values of all pixels excluding boundary pixels, guard pixels,...

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CMOS area image sensor S14501-7

CMOS area image sensor High-speed mode Global shutter mode Parameter Offset output*23 Offset variation*24 Dark output*23 Saturation exposure*25 Photosensitivity*25 Saturation output*26 Random noise*23 Dynamic range*27 Conversion factor Symbol Voffset DSNU DS Lsat Sw Vsat RN Drange Unit DN DN rms DN/s lx∙s DN/lx∙s DN DN rms dB μV/eDN/e- Rolling shutter mode Parameter Conversion factor Average output of all pixels excluding boundary pixels, guard pixels, and defective pixels under light-shielded condition Standard deviation of output values of all pixels excluding boundary pixels, guard pixels, and...

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CMOS area image sensor S14501-8

CMOS area image sensor Spectral response (typical example) Spectral transmittance of window material Block diagram Charge pump circuit Pixel control Vertical shift register Quantum efficiency (%) 15 Photodiode array LVDS Output outA [2:0] outB [2:0] outC [2:0] outD [2:0] outE [2:0] Vsync Hsync Pclk CTR Horizontal shift register Timing generator MCLK TG_reset PLL_reset MST Serial peripheral interface Bias circuit SPI_SCLK SPI_CS SPI_RSTB SPI_MOSI KMPDC0529EC

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CMOS area image sensor S14501-9

CMOS area image sensor Port assignment Setting using the SPI and the like The following parameters can be set using the serial peripheral interface (SPI). However, use MST (external input signal) to set the integration time and blanking period in external start mode. Parameter Shutter mode (Default: rolling shutter mode) Frame start mode (Default: internal start pulse mode) Mode and explanation Rolling shutter mode Rolling shutter mode is advantageous in that readout noise is small because readout is performed through the CDS circuit. However, the disadvantage is that the integration start/end...

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