
STest£(>Rapid-Rate Thermal Cycle Chamber EATH Series TestEQ has launched the High-performance EATH series Which complies with IEC standards and offers a temperature change rate of 5-30°C/min. It is ideally suited for demanding temperature cycling test standards in advanced industries such as semiconductors, electronics, and automotive. - Product temperature control of linear 30°C/min. - It features high control accuracy with a fluctuation of <0.5°C, coupled with a temperature deviation of less than ±1.5°C. Designed to meet severe testing standards such as: AI Smart Module: Without it, heat load cannot be conve * Please contact Te stEQ for mor e information, about which products can be connected.
Open the catalog to page 1Rapid-Rate Thermal Cycle Chamber EATH Series Become more efficient. Use our solutions to save time and money. Developed exclusively for you: the unique software simulation package for the perfect testing process. Process management/documentation/networking/WIFI 1.Up to16 sets chamber can be networked 2.Programs for automatic processes 3.Documenting ,visualising and managing process data 4.Traceability of process data for seamless quality control TestEQ independently developed the 3.0 operating system 1.Traceable runtime data for seamless quality control in test chamber operations. 2. Worry-free...
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