Surface Insulation Resistance Testing System Introducing the next generation AutoSIR2+ system from Gen3 Measuring resistance changes derived through Electrochemical Migration (ECM) The new AutoSIR2+ system represents a dramatic improvement over existing SIR test alternatives, and its shielded precision electronics allows state-of-the-art accuracy resistance measurements to be made up to 1014 Ω. One AutoSIR2+ chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), which encourages growth of dendrites for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money. www.gen3systems.com Features: Measurement Time: <10 seconds to scan, measure, and display all 256 channels Measurement Method: Continuous on all selected channels Measurement Test Intervals: Fully selectable from a minimum of 1 minute Surface Insulation Resistance Testing S

GEN3 – Continuing to set the standard Aside from “conventional” SIR and CAF testing, industry trends impacting on reliability and testing announced in 2018 now demand: Automotive: ISO PASS 19295:2016(E) Electric The AutoSIR2+ continues to feature: • No switching: When the measurement and test bias are the same, no switching takes place as the voltages are continuously applied Specifications Applied Voltage • Fast data acquisition: Measurement per channel is less than 15milliseconds • Flexibility: Capable of testing to all existing test specifications IPC - IEC - JNC and other user specifications...