TL2000
TL2000
The TL2000 is an automated system designed for the electro-optical characterization of semiconductor chips, including laser diode bars, single chips, and chips on submounts. It offers flexibility in testing configurations, allowing for measurements on entire bars or individual emitters.
- Steel base with a pneumatic door cover.
- Control system includes a PC, dual 17” TFT displays, keyboard, and trackball.
- Motion control system supports linear and rotary motion.
- Pneumatic switchboard panel for operations.
- Temperature-controlled for reliable device fixture and control.
- Supports various DUT designs with a temperature range of 20°C to 60°C and stability of +/- 1°C.
- Available in 1 or 3 chuck geometries.
- Laser safety design (Class 1) with easy probe head changes.
- Features electronically adjustable force control and a camera system for automated process control.
- Integration sphere with optional water cooling.
- Customizable current driver, integrating sphere, photo diodes, and spectrum analyzers.
- Current range: 0 to 5 A for single emitters, up to 100 A for full bars.
- Pulse width: 500 ns to 10 ms; Spectral range: 100 nm within 350 to 1600 nm.
- Performs LIV, spectral, and far & near field tests.
- Fully automatic device handling with easy probe head changes.
- Supports component top side and facet inspection.
- Compatible with SQL and other database systems for data traceability.
- Characterization of unmounted laser diode bars and VCSELs.
- Testing of photodiode bars and chips on submounts (COS).
- Full testing of high-power laser diode bars.
- Features X, Y, Z axis with travel of 800, 200, 100 mm and Phi-Z axis with 270° rotation.
- Resolution of 100 nm and repeatability of ± 1 µm.
fi conTEC Service GmbH is ISO 9001:2008 certified by DNV GL/Hamburg, Germany.
- Europe: fi conTEC Service GmbH, Germany.
- USA: fi conTEC (USA) Corporation, California, USA.
- Asia: fi conTEC Trading (Shanghai) Limited Company, Shanghai, PRC.
Catalog excerpts
Opto-electronics Chip Tester micro assembly machines
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ficonTEC’s series of testing machines is focused on automated electro-optical characterization of semiconductor chips. The ficonTEC TL2000 is a fully automated test and inspection system for unmounted laser diode bars, single chips and chips on submounts. The system can be configured to perform measurements on the complete bar at once or on each individual emitter of the bar. Typical measurements are LIV tests, spectral characterization, and examination of the far field distribution. Vacuum Chuck The temperature controlled vacuum chuck is the element responsible for reliable fixture of the device...
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• Electro-optical characterization of unmounted laser diode bars • Characterization of VCSEL • Characterization of bare single chips • Test of photodiode bars • Test of chip on submount (COS) • Full test of high power laser diode bars (Full Bar Test) Measurement Technology Current driver, integrating sphere, photo diodes, spectrum analysers and test equipment is chosen according to the customer application. The following boundaries can be set: • Current range: 0 to 5 A Single • Emitter: 0 to 100 A Full Bar (higher on request) • Pulse width: 500 ns to 10 ms • Spectral range: 100 nm out of 350...
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Easy Operation Interface As a unique feature all ficonTEC machines offer a sophisticated component tracking throughout the entire machine process and across ficonTEC machines. All machines run the same machine software for easy operation and portability. ficonTEC Service GmbH, Rehland 8, 28832 Achim, Germany Phone: +49 4202 51160-0, Fax: +49 4202 51160-090 Mail: [email protected] USA ficonTEC (USA) Corporation, 25 Calle Canela, San Clemente, CA 92673, USA Phone: +1 949 388-5800, Fax: +1 949 388-1489 Mail: [email protected] ASIA ficonTEC Trading (Shanghai) Limited Company Rm. 303, Floor 3, No....
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