SEMICONDUCTOR TESTING PRODUCTS Wafer Probe Card solutions

WAFER PROBE CARD SOLUTIONS Wafer Probe Card Excellence As numerous as the applications for semiconductor components and modules are the requirements to set up a suitable test strategy. Key is always to ensure the desired function during and after wafer processing before the bare die is further packaged and assembled. A maximized yield and a low-wear contacting solution resulting in a low total cost of ownership are therefore central. FEINMETALL convinces with years of experience in comprehensive advice and project-specific contacting solutions as well as further service support worldwide. Our...

PRODUCT PORTFOLIO ViProbe® - The Established Solution Customizable to an enormous range of applications and probing materials it is the vertical solution in the market for many years and especially appreciated for its unique simple reparability. Page 4 ViProbe® II - The Next Generation With multiple lifetime extension options and various security features for the DUT, the ViProbe®II brings all the advantages of the ViProbe® to the next level. Page 4 LiProbe® - The Lamella Solution Lamella probes offer various advantages in terms of RF and force requirements. The short length of the probe as well...

WAFER PROBE CARD SOLUTIONS Vertical Probe Card ViProbe® and ViProbe®II - From the Established Solution to the Next Generation For years, the FEINMETALL ViProbe® has dominated the vertical probe card industry. Several advantages such as the stable contact performance as well as the simple exchange of the contact elements and outstanding temperature behavior make this probing solution the favorite to the automotive industry. With the introduction of the next generation of vertical wafer probing, the ViProbe®II, all these advantages are extended by multiple lifetime extension options and further...

WAFER PROBE CARD SOLUTIONS Probe Card LiProbe® - The Lamella Solution The FEINMETALL LiProbe® is the solution for advanced probing requirements. It has been designed to ensure a specific contact force as well as maintaining it over the whole lifetime. The lamella technology allows the probe to be much shorter than a conventional buckling beam and therefore is used in applications which require advanced frequency requirements. Due to the flexibility of the probe design it is possible to equip a probe head with probes in different geometries depending on their specific function. Advantages • Shortness...

WAFER PROBE CARD SOLUTIONS FeinProbe®- The Spring Probe Solution The FEINMETALL FeinProbe® uses contact probes as contact elements for contacting bumped wafers for WLCSP, SiP and Flip Chip Applications. By using FEINMETALL contact probes, the probe solution has several advantages because of the independent spring loaded pins and the crown tip of the contact element. This ensures a stable contact without a stressful impact on the bumps. Even more, signal transmission can be guaranteed when applying specific design rules. Advantages • Stable contact performance in terms of low contact resistance...

WAFER PROBE CARD SOLUTIONS FeinProbe®II- WLCSP Head Design New Feinmetall ceramic head design as vertical test solution. The precise ceramic design enables high quality, highest design flexibility as well as reliable and fast automated assembly or maintenance of the integrated contact elements. FeinProbe II offers the benefits of both fast delivery times and favorable pricing. Fast delivery time due to automatic spring probe assembly High quality due to accurate ceramic design High design flexibility enables compatibility with any connector Easy maintenance 5G proven wafer testing technology...

Customer Oriented Probe Card Service - All Over the Globe For your tailored support we offer various levels of service agreements, combining some important advantages: → On-the-spot support - we are where our probe cards are → Guaranteed turnaround times → Custom-tailored solution from small repairs to complete repair shop management → High competence and deep understanding of customer needs Please contact us directly by email: [email protected] CONTACT SEMICONDUCTOR TESTING PRODUCTS [email protected] FEINMETALL GMBH | HERRENBERG, GERMANY (+49) 7032 2001-0 | [email protected]...