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We present our Business Units: At FEINMETALL, we are technology leaders in the field of contacting solutions with a worldwide reputation for high standards, outstanding precision, uncompromising quality and our ability to solve the technical challanges of our customers and future markets. Electronic Test Wire Harness Test Battery & High Current Test Interface Solutions Fine Pitch Test Semiconductor Test

THE RIGHT SOLUTION FOR EVERY CELL TYPE AND EVERY APPLICATION BATTERY CONTACTING & E-MOBILITY Battery cell test and formation in general Reliable and high-quality battery cell production requires complex high performance contacting during several steps of the production. The quality of battery cells is reflected in a wide variety of parameters such as electrochemical stability, capacity, performance or service life. End-of-line quality assessment of battery cells in the form of quality determination and evaluation in cell production helps to identify optimization potential at an early stage, minimize...

ADVANCED SOLUTIONS FOR WIRE HARNESS AND CONNECTOR TESTING WIRE HARNESS TEST Wire harness test in general The wire harness is working as the nerve system in the car – every electric component receives the signal through it and ensures that all devices work effectively with each other. In general, the wire harness consists of individual cables and those wires are bundled in the cable harness and hold together by clamps, cable ties or tubes. Due to the importance of the wire harness it is necessary to ensure that the wire harness works 100% without failure after mounting in the car. In addition,...

ADVANCED SOLUTIONS FOR WIRE HARNESS AND CONNECTOR TESTING WIRE HARNESS TEST Position test For the position test step probes are used. They allow the testing of the correct terminal position inside of the connector housing. If a terminal is not mounted correctly, the plate of the step probe blocks at the housing. As a result, the probe does not create an electrical contact. Push back test Push back probes have a very high spring force to test if the connector terminals are mounted correctly. If so, they will withstand the pressure and compress the probe. Through this, a switch function will get...

RADIO FREQUENCY TEST Radio frequency test in general RF solutions are used in the different markets such as automotive, communication and industry in general. For transmitting RF signals with coaxial probes the inner conductor carries the signal whereas the outer conductor serves as a shielding. Typical applications are contacting various standard RF connectors or sockets like e.g. FAKRA, HSD, SMA, SMB, SMC connectors or even very small SMD assembled switch connectors or direct test points on a PCB. RF-automotive Automotive connectors are used in a huge variety of electronic-hardware in the automotive...

ELECTRONIC PCB TEST Electronic test in general For the in-circuit and functional test of PCBs standard probes in the centers 50 mil, 75 mil and 100 mil are most commonly used. In these applications long lifetime, reliable contacts and great variety of tip styles and spring forces are essential. Additionally, for many applications special solutions are required like e.g. for contacting lead-free soldered pads as well as contaminated, oxidized or OSP-coated boards. Probes for ICT/FCT electronic test For the in-circuit and functional test of PCBs basic probes in the centers 50 mil, 75 mil and 100...

INTERFACE SOLUTIONS Interfaces in general Spring contact probes as an interface offer many advantages in the field of signal transmission, power transfer and data exchange between different devices or circuits. They provide a reliable electrical connection with a stable low resistance, even under vibration or mechanical stress. This stability contributes to the overall integrity of data transmission. In addition, these solutions are characterized by their durability, as they have a long lifetime that significantly reduces maintenance and replacement costs. In addition, interface solutions are...

HIGH QUALITY SOLUTIONS DOWN TO PITCH 120ΜM FINE PITCH TESTING Fine pitch test in general Whenever very small pitched test points need to be contacted fine pitch probes are the solution. Especially in the Semiconductor final testing, MEMS Sensor testing, WLCSP Solutions and the testing of miniature PCBs the pitches are very small and require reliable Fine Pitch Spring Probes. FEINMETALL offers high quality contact probes aimed to advance our customers test yield. We are always chasing the edge of what is possible and offer fine pitch probes down to 120µm Pitch. Our probes feature high repeatability,...

SEMICONDUCTOR TESTING Wafer probe card excellence As numerous as the applications for semiconductor components and modules are the requirements to set up a suitable test strategy. Key is always to ensure the desired function during and after wafer processing before the bare die is further packaged and assembled. A maximized yield and a low-wear contacting solution resulting in a low total cost of ownership are therefore central. FEINMETALL convinces with years of experience in comprehensive advice and project-specific contacting solutions as well as further service support worldwide. ViProbe®...

CONTACT E-MOBILITY & BATTERY CONTACTING [email protected] ELECTRONIC TESTING [email protected] FINE PITCH TESTING [email protected] INTERFACE SOLUTIONS [email protected] SEMICONDUCTOR TESTING PRODUCTS [email protected] WIRE HARNESS TESTING [email protected] PASSION FOR FINEST TECHNOLOGY. > FEINMETALL.COM 20 1131136 - PRODUCT OVERVIEW / Version 1.1