FINE PITCH TESTING

Product catalog summary

Overview of Fine Pitch Testing
Fine pitch probes are essential components in the electronics industry, used for testing and measuring electronic components and circuits with very small dimensions. These probes are typically used in semiconductor final testing, MEMS sensor tests, and micro PCB testing. They are designed to ensure accurate and reliable testing by providing precise contact with test points.

Specifications of Fine Pitch Probes
Fine pitch probes are available in various sizes, with diameters ranging from 0.11 mm to 0.57 mm and lengths from 3.2 mm to 7.2 mm. They are mounted in sandwich design blocks to connect a Device Under Test (DUT) with a PCB. The probes are not suitable for direct soldering or use with larger diameter receptacles.

Applications and Benefits
1. MEMS Sensor Testing: Fine pitch probes allow engineers to access specific points on MEMS sensors for comprehensive testing and analysis, ensuring performance accuracy.
2. Semiconductor Final Testing: These probes are crucial for ensuring only high-quality semiconductors reach the market, supporting various chip package types like BGA, QFN, LGA, and QFP.
3. PCB Testing: Essential for verifying the functionality of compact electronic devices, fine pitch probes ensure reliable connections with micro PCBs.

Technical Specifications
Fine pitch probes are designed with various mechanical and electrical specifications, including:
- Current carrying capability up to 3.8 A
- Resistance typically less than 100 mOhm
- Self-inductance ranging from 0.81 nH to 2.07 nH
- Frequency response up to 35 GHz
- Operating temperature range from -45°C to +200°C

FeinProbe® Probe Cards
FeinProbe® is a solution by FEINMETALL for WLCSP test solutions, combining high-end probe cards and contact probes. These probe cards support a wide range of applications, offering advantages such as short cycle manufacturing, compatibility with various connectors, and support for frequencies up to 80 GHz.

Contact Information
For inquiries related to fine pitch testing, electronic testing, and semiconductor testing products, contact FEINMETALL through their respective email addresses provided in the document.

Catalog excerpts

FINE PITCH TESTING Chasing the edge of what is possible

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FINE PITCH PROBES AT A GLANCE Mounting of fine pitch probes Fine pitch probes are extremely thin contact probes for the use in centers of 0,12 mm to 1,0 mm. In most cases fine pitch probes are not mounted in separate receptacles, but they are mounted in sandwich design blocks connecting a DUT with a PCB. Typical applications are contacting PCBs with very small structures and building up test sockets. In these centers direct soldering of probes as well as using receptacles with larger diameters is not possible any more. Therefore, most fine pitch probes are used in floating movement that connect...

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HIGH QUALITY SOLUTIONS DOWN TO A PITCH OF 120µM FINE PITCH TESTING Fine pitch testing in general When it comes to the contacting of test points in very small dimensions, fine pitch probes are needed. Fine pitch probes are essential parts in the electronics industry, ensuring accurate and reliable testing and measurement of electronic components and circuits. These probes mainly find application in areas such as semiconductor final testing, WLCSP solutions, MEMS sensor tests or the testing of micro PCBs. Due to the small pitches in these applications, a deep expertise and precision in production...

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Double plunger probe one side fixed Double plunger probe FP110DF-L047 Centers (mm/mil) Self Inductance Mechanical Specifications Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Self Inductance Mechanical Specifications Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Plungers Barrel Spring Palladium alloy, unplated Nickel, gold plated Spring steel, gold plated Drill hole recommendation (mm) FP260D-L072 Double plunger probe Double plunger probe FP200D-L037 Centers (mm/mil) Self Inductance Centers (mm/mil) Self Inductance Mechanical Specifications Preload...

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Double plunger probe Single plunger probe Centers (mm/mil) Self Inductance Mechanical Specifications Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Plungers Barrel Spring Barrel Spring Self Inductance Barrel Spring Palladium alloy, unplated; BeCu, gold plated Nickel, gold plated Spring steel, gold plated Drill hole recommendation (mm) FP380D-L030 Centers (mm/mil) Self Inductance Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Materials and Plating Plungers Double plunger probe...

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FEINPROBE PROBE® CARDS FeinProbe® - The contact probe solution FEINMETALL offers a variety of contacting solutions. For the semiconductor industry, our solutions reach from probe cards for frontend testing to contact probes for the backend final test. FeinProbe® is FEINMETALL WLCSP test solutions using contact probes as contact elements for the probe card. With FeinProbe® we combine our longstanding experience in manufacturing high end probe cards and contact probes. FEINMETALL offers comprehensive advice and projectspecific contacting solutions to address the diverse needs of our customer. Our...

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CONTACT E-MOBILITY & BATTERY CONTACTING [email protected] ELECTRONIC TESTING [email protected] FINE PITCH TESTING [email protected] INTERFACE SOLUTIONS [email protected] SEMICONDUCTOR TESTING PRODUCTS [email protected] WIRE HARNESS TESTING [email protected] PASSION FOR FINEST TECHNOLOGY. > FEINMETALL.COM 1131133 - FINE PITCH TESTING / Version 1.1

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FINE PITCH TESTING

FINE PITCH TESTING

Catalog excerpts

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