FINE PITCH TESTING
7Pages

FINE PITCH TESTING Chasing the edge of what is possible

FINE PITCH PROBES AT A GLANCE Mounting of fine pitch probes Fine pitch probes are extremely thin contact probes for the use in centers of 0,12 mm to 1,0 mm. In most cases fine pitch probes are not mounted in separate receptacles, but they are mounted in sandwich design blocks connecting a DUT with a PCB. Typical applications are contacting PCBs with very small structures and building up test sockets. In these centers direct soldering of probes as well as using receptacles with larger diameters is not possible any more. Therefore, most fine pitch probes are used in floating movement that...

HIGH QUALITY SOLUTIONS DOWN TO A PITCH OF 120µM FINE PITCH TESTING Fine pitch testing in general When it comes to the contacting of test points in very small dimensions, fine pitch probes are needed. Fine pitch probes are essential parts in the electronics industry, ensuring accurate and reliable testing and measurement of electronic components and circuits. These probes mainly find application in areas such as semiconductor final testing, WLCSP solutions, MEMS sensor tests or the testing of micro PCBs. Due to the small pitches in these applications, a deep expertise and precision in...

Double plunger probe one side fixed Double plunger probe FP110DF-L047 Centers (mm/mil) Self Inductance Mechanical Specifications Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Self Inductance Mechanical Specifications Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Plungers Barrel Spring Palladium alloy, unplated Nickel, gold plated Spring steel, gold plated Drill hole recommendation (mm) FP260D-L072 Double plunger probe Double plunger probe FP200D-L037 Centers (mm/mil) Self Inductance Centers (mm/mil) Self Inductance Mechanical Specifications...

Double plunger probe Single plunger probe Centers (mm/mil) Self Inductance Mechanical Specifications Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Plungers Barrel Spring Barrel Spring Self Inductance Barrel Spring Palladium alloy, unplated; BeCu, gold plated Nickel, gold plated Spring steel, gold plated Drill hole recommendation (mm) FP380D-L030 Centers (mm/mil) Self Inductance Preload (cN) Spring Force (cN) Nominal travel (mm) Maximum travel (mm) Materials and Plating Plungers Double plunger...

FEINPROBE PROBE® CARDS FeinProbe® - The contact probe solution FEINMETALL offers a variety of contacting solutions. For the semiconductor industry, our solutions reach from probe cards for frontend testing to contact probes for the backend final test. FeinProbe® is FEINMETALL WLCSP test solutions using contact probes as contact elements for the probe card. With FeinProbe® we combine our longstanding experience in manufacturing high end probe cards and contact probes. FEINMETALL offers comprehensive advice and projectspecific contacting solutions to address the diverse needs of our customer....

CONTACT E-MOBILITY & BATTERY CONTACTING battery@feinmetall.com ELECTRONIC TESTING electronic@feinmetall.com FINE PITCH TESTING finepitch@feinmetall.com INTERFACE SOLUTIONS interface@feinmetall.com SEMICONDUCTOR TESTING PRODUCTS semiconductor@feinmetall.com WIRE HARNESS TESTING wireharness@feinmetall.com PASSION FOR FINEST TECHNOLOGY. > FEINMETALL.COM 1131133 - FINE PITCH TESTING / Version 1.1