Catalog excerpts
PRODUCT LAUNCH FeinProbe ll® New Feinmetall ceramic head design as vertical test solution. The precise ceramic design enables high quality, high design flexibility as well as reliable and fast-automated assembly or maintenance of the integrated contact elements. Key features: Low cost test solution Short lead time Edition 04/2023. All rights reserved. Further information can be found at www.feinmetall.com
Open the catalog to page 1
PRODUCT LAUNCH Probe Parameters* Spring Probe Length Minimum Pitch Full Array Minimum Bump Diameter Electrical Planarity Spring Probe Resistance Test Temperature Pointed / Wedge / Crown *Range depends on selected spring contact probe Edition 04/2023. All rights reserved. Further information can be found at www.f
Open the catalog to page 2All Feinmetall GmbH catalogs and technical brochures
-
WIRE HARNESS TESTING9 Pages
-
INTERFACE SOLUTIONS7 Pages
-
FINE PITCH TESTING7 Pages
-
ELECTRONIC TESTING9 Pages
-
Product Portfolio11 Pages
-
contact probes148 Pages
-
FOR THE ENVIRONMENT2 Pages
-
TEST CONNECTORS4 Pages
-
POGO CONNECTORS8 Pages
-
PRODUCT PORTFOLIO CONTACT PROBES20 Pages
-
HIGH CURRENT PROBES20 Pages
-
WAFER PROBE CARD SOLUTIONS8 Pages
