switch probes step probes threaded probes push back probes contact probes for wire harness test

CONTENTS Competence FEINMETALL is your partner for the reliable contacting of electronic components. The wide range of applications for spring contact probes includes board tests with fine centers up to wire harness and connector tests with individual and intelligent solutions. the laser marking guarantees the use of “the original”. FEINMETALL is certified according to DIN ISO 9001. Additionally a wide range of measures like e.g. risk analysis by FMEA during the whole product development process ensure a maximum of technical as well as delivery reliability. Customer Focus Our engineers and technicians...

Threaded Probes F731 F732 F733 F734 F737 F88890M2104G150 Twist Proof Probes F751 F752 F754 F755 F756 F760 Push Back Probes V03 V04 VF100 VF3 VF4 VF4 with elastic round head Probes for E-Mobility NEW HC08 (Sockets) NEW HC09 (Pins) NEW HC10 (Pins) NEW HC11 (Sockets) F762C (for Contacting Flat Blade Connectors) Probes for Connector test continuity test F822 (Fakra) F835 (HFM® / MATE-AX ®) F819 (HSD) Test connectors Probes for RF - Connectors NEW HF66 (Fakra) NEW HF77 (HFM® / MATE-AX ®) NEW HF77 (H-MTD ®) HF819 (HSD) HF860 (Fakra) Kelvin Probes F810 F822 F832 F835 Tools / Accessories Spacers FEWZ...

GENERAL BASICS Overview of Tip Styles Concave stepped Serrated stepped Flexible Needle Spherical stepped 4-point crown stepped (self cleaning Flat stepped 4-point crown stepped (self cleaning) 4-point crown (self cleaning) Special version for contacting into connector housings Rigid needle 15° stepped 3-point crown stepped (self cleaning) 36 6-point crown with middle pin stepped 6-point crown stepped (self cleaning) Conical 120° with eccentric cut 50 Concave with drill hole stepped 55 Concave (self cleaning) 8-point crown stepped (self cleaning) Mini-serrated stepped Serrated stepped (self cleaning)...

GENERAL BASICS Overview of Tip Styles Spade spadeØ < plungerØ Reduced spade spadeØ < plungerØ Spade spadeØ = plungerØ Spade spadeØ > plungerØ Reduced spade spadeØ > plungerØ Square spade Square spade not centric Special version for spade tips Rolling ball Special Versions Concave stepped C = High current (marked by groove) Spherical stepped Flat stepped H = Synthetic head with ring T = Insulated BeCu head Special Head Made of Silver Alloy In high current applications ideally no voltage should apply and accordingly no current should flow during closing or releasing the contact. Otherwise, an electric...

GENERAL BASICS Typical Tip Styles and Applications Conical (01,02,03,10,18,32,34,35) Universal tip style with different angles of 10°, 15°, 30°, 60°, 90° or 120° for contacting solder pads and vias. Serrated, W-profile (06,46,64,66) Universal tip style for contacting wires, pins and wire wrap posts, even suitable for bent contacts. Hexagonal (07,08) For testing plated vias and pads. The sharp edges penetrate contamination and oxide layers. Spherical (11,12) For testing clean contact surfaces, does not leave marks or scratches. Flat (16,17) Suitable for solder pads and contact pins. Triangular...

GENERAL BASICS Design of Spring Contact Probes Spring contact probes are typically composed of a plunger, a barrel and a spring. Plunger FEINMETALL manufactures plungers with many different tip styles, suitable for a large variety of applications. Plungers are generally made from beryllium copper (BeCu) or steel. Optimized turning and plating processes are resulting in an outstanding straightness and exactness of the plunger surface, the base for a long lifetime. Aggressive tip styles are made by a special grinding process for ultra sharp edges. Barrel FEINMETALL barrels are usually made of nickel...

GENERAL BASICS Materials The optimum performance of spring contact probes significantly depends on the selection and combination of materials and platings. Developing, testing and qualifying materials for the various applications is an important aspect of our research and development efforts. Basic Materials For choosing the optimum basic material for barrel, plunger, spring and receptacle of spring contact probes different aspects need to be considered. Besides the technical applicability also machining and economical factors are relevant for this decision. Beryllium-Copper combines outstanding...

GENERAL BASICS Plating Materials Typically the surfaces of all elements of contact probes are galvanically plated in order to protect the basic material against corrosion. At the assembled contact probe the plating also reduces friction and thereby leads to low abrasion and low contact resistances. FEINMETALL plating materials are basically galvanic nickel, chemical nickel, gold, hard gold, longtime gold, rhodium, silver or progressive coating. To achieve the maximum performance the ideal selection and combination of coating materials, coating thicknesses, coating alloys as well as various boundary...

GENERAL BASICS Push Back Probes During push back tests of connectors the tight seat of the connector elements is verified. For this application contact probes with very high spring forces are used. Kelvin Probes Very low resistances of components are measured by the 4-wire measurement (Kelvin-method). For this application contacts for the current source and the voltmeter need to be implemented very close to the component. These connections can be realized by special coaxial probes (Kelvin probes), using the outer conductor for the constant current and the inner conductor for measuring the voltage....

GENERAL BASICS Life Cycle Test of Contact Probes For us as manufacturer of these probes, it is vital to permanently control and review the quality parameters and to analyze the lifetime performance of our products. In our own laboratory we have various test and measurement setups for quality control and for the determination of technical parameters during research and development. One important subject is the life cycle test, conducted with several autonomous stress stages. For the life cycle test up to 10 sample probes are mounted in a stress stage and then pressed with a stroke frequency of...