FOD8383 2.5 A Output Current, High-Speed, MOSFET/IGBT Gate Drive Optocoupler in Optoplanar® Wide-Body SOP 5-Pin
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2.5 A Output Current, High-Speed, MOSFET/IGBT Gate Drive Optocoupler in Optoplanar® Wide-Body SOP 5-Pin ■ Reliable and High-Voltage Insulation with Greater than 10 mm Creepage and Clearance Distance and 0.5 mm Internal Insulation Distance ■ 2.5 A Output Current Driving Capability for Medium- Power IGBT/MOSFET - P-Channel MOSFET at Output Stage Enables Output Voltage Swing Close to Supply Rail ■ 35 kV/us Minimum Common Mode Rejection ■ Wide Supply Voltage Range: 15 V to 30 V ■ Fast Switching Speed Over Full Operating Temperature Range - 210 ns Maximum Propagation Delay - 65 ns Maximum Pulse-Width Distortion ■ Under-Voltage Lockout (UVLO) with Hysteresis ■ Extended Industrial Temperate Range: -40°C to 100°C ■ Safety and Regulatory Approvals: Insulation Voltage ■ AC and Brushless DC Motor Drives ■ Uninterruptible Power Supply ■ Isolated IGBT/Power MOSFET Gate Drive Related Resources ■ FOD3184—3A Output Current, High-Speed MOSFET/IGBT Gate Drive Optocoupler Datasheet ■ www, fairchildsemi. corn! products/opto! The FOD8383 is a 2.5 A output current gate drive optocoupler capable of driving medium-power IGBT/ MOSFETs. It is ideally suited for fast-switching driving of power IGBT and MOSFET used in motor-control inverter applications and high-performance power systems. The FOD8383 utilizes Fairchild's Optoplanar® coplanar packaging technology and optimized IC design to achieve reliable high-insulation voltage and high-noise It consists of an Aluminum Gallium Arsenide (AIGaAs) Light-Emitting Diode (LED) optically coupled to an integrated circuit with a high-speed driver for push-pull MOSFET output stage. The device is housed in a wide body, 5-pin, small-outline, plastic package. Functional Schematic Figure 2. Package Outline ©2014 Fairchild Semiconductor Corporation

Truth Table ©2014 Fairchild Semiconductor Corporation

Safety and Insulation Ratings As per DIN EN/IEC60747-5-5, this optocoupler is suitable for "safe electrical insulation" only within the safety data. Compliance with the safety ratings shall be ensured by means of protective circuits. ©2014 Fairchild Semiconductor Corporation

Absolute Maximum Ratings Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. TA = 25°C unless otherwise specified. ©2014 Fairchild Semiconductor Corporation

Isolation Characteristics Apply over all recommended conditions; typical value is measured at TA = 25°C. 7. In this test, VQH is measured with a dc load current of 100 mA. 8. Maximum pulse width = 1 ms, maximum duty cycle = 20%. When driving capacitive load VQH will approach VDD ©2014 Fairchild Semiconductor Corporation

Switching Characteristics Apply over all recommended conditions, typical value is measured at VDD: otherwise specified. 9. Propagation delay tPHL is measured from the 50% level on the falling edge of the input pulse to the 50% level of the falling edge of the VQ signal. 10. Propagation delay tPLH is measured from the 50% level on the rising edge of the input pulse to the 50% level of the rising edge of the VQ signal. 11. PWD is defined as | tPHL - tPLH | for any given device. 12. The difference between tPHL and tPLH between any two FOD8383 parts under the same operating conditions, with...

Typical Performance Characteristics Figure 8. Output Low Voltage Figure 9. Output Low Current ©2014 Fairchild Semiconductor Corporation

Typical Performance Characteristics (Continued) Figure 15. Propagation Delay ©2014 Fairchild Semiconductor Corporation

Typical Performance Characteristics (Continued) VDD-VSS - SUPPLY VOLTAGE (V) Figure 20. Under-Voltage Lockout ©2014 Fairchild Semiconductor Corporation

Test Circuit Pulse Generator Test Conditions: Pulse Generator Test Conditions: Power Supply Power Supply Figure 22. lOHTest Circuit ©2014 Fairchild Semiconductor Corporation

Test Circuit (Continued) Figure 25. IDDH Test Circuit Figure 26. IDDL Test Circuit ©2014 Fairchild Semiconductor Corporation

Test Circuit (Continued) Figure 27. IFLH Test Circuit Figure 28. VFHLTest Circuit Figure 29. UVLO Test Circuit ©2014 Fairchild Semiconductor Corporation

Test Circuit (Continued) Figure 30. tPHL, tPLH, tR, and tF Test Circuit and Waveforms Figure 31. CMRTest Circuit and Waveforms ©2014 Fairchild Semiconductor Corporation

Reflow Profile Figure 32. Reflow Profile ©2014 Fairchild Semiconductor Corporation

Ordering Information ©2014 Fairchild Semiconductor Corporation

C A-B D LAND PATTERN RECOMMENDATION SEATING PLANE NOTES: UNLESS OTHERWISE SPECIFIED SEATING PLANE SCALE: 3.2:1 A) THIS PACKAGE DOES NOT CONFORM TO ANY STANDARD. B) ALL DIMENSIONS ARE IN (R0.54) MILLIMETERS. C) DIMENSIONS ARE EXCLUSIVE OF BURRS, MOLD FLASH AND TIE BAR PROTRUSIONS D) DRAWING CONFORMS TO ASME 0.25 Y14.5M-1994 0.19 E) DRAWING FILE NAME: MKT-M05AREV3

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