CIX100 Turnkey Solution for Technical Cleanliness Inspection

Simplify Your Technical Cleanliness The cleanliness of components, parts, and fluids is at the center of the manufacturing process. Meeting high standards for counting, analyzing, and classifying the often micron-sized contaminant and foreign particles is important for all processes: development, manufacturing, production, and quality control. International and national directives describe the methods and documentation requirements for determining particle contamination on essential machined parts since these particles directly impact the lifespan of parts and components. As a first step, residue...

Seamlessly integrated hardware and software result in a durable, high-throughput system that delivers reliable and accurate data. Dedicated, easy-to-use workflows minimize user action and provide reliable data — independent of the operator and experience level. User-friendly tools make it easy to revise inspection data. For greater flexibility, the system supports a separate microscope mode with optional material analysis solutions. The innovative all-in-one-scan solution enables scans with classification in reflective and non-reflective particles to be completed twice as fast as other inspection...

Reliable Turnkey Solution Automated and Accurate for High Reproducibility The CIX100 system is a turnkey solution designed to meet the needs of automated cleanliness inspection. Each component is optimized for accuracy, reproducibility, repeatability, and seamless integration for reliable data in a high-throughput system. The system provides excellent optical performance for fast inspections of circular and rectangular inspection areas. Automation of critical tasks helps speed up inspections while minimizing human errors and the risk of contaminating the sample.

Excellent Optical Quality, Mechanical Stability, and Security Our renowned UIS2 objectives and a high-resolution camera provide high optical performance and exceptional image quality for excellent measurement and analysis accuracy. A dedicated light source maintains a consistent color temperature optimized for cleanliness inspection. The optical path alignment, motorized nosepiece, and camera are protected by a cover to prevent accidental misalignments. For system and calibration stability, all moving parts have been eliminated from the optical light path. Critical parameters remain unchanged...

Intuitive Guidance Maximum Productivity for Every Level of Experience The CIX100 system delivers enhanced performance and productivity through the entire inspection process and makes technical cleanliness inspections easy for operators of every experience level. The software provides step-by-step guidance for the entire cleanliness inspection. Intuitive workflows and user rights management improve productivity and confidence in results while reducing cycle time, cost per test, and user errors. The result is a system optimized for high quality standards.

Guided Workflows The interface has large buttons that are easy to click with a mouse or the touch-screen monitor. Step by step, the intuitive interface guides you through the complete inspection process. The result is a fast, productive workflow. With a click of a button, start scanning the membrane using the selected inspection configuration, review scanned or stored results (including validation), or create and print reports that comply with industry standards. Easy for Every Experience Level The preconfigured, pre-calibrated system combined with an intuitive user interface makes cleanliness...

OLYMPUS Cleanliness Inspector £LH Inspect Sample Acqurr CvnpJr 0 © Sample overview Sample information Classification measurement fcrct Max. [pm] Count result: Sample results Overall approval: Normalized count (part) All Relevant Data Displayed in One Place The CIX100 system offers high-performance image acquisition and precise live analytics of both reflective and non-reflective particles ranging from 2.5 pm up to 42 mm in a single scan thanks to a patented* polarization method. This all-in-one-scan solution enables scans to be completed twice as fast as the classical method (Inspector series)....

All-in-One Scanning for High Throughput An innovative polarization method based on wavelength separation and color detects both reflective (metallic) and non-reflective (nonmetallic) particles in a single scan. Integrated into the microscope frame, this high-throughput design enables scans to be completed twice as fast as the classical method (Inspector series) and eliminates moving components from the optical light path, such as the polarizer, which could negatively impact the system stability and lead to potentially incorrect results. This all-in-one-scan technique increases the number of inspected...

CJ? OLYMPUS Cleanliness Inspector Particle View Sample Image Live Observation Snapshot View Inspect Sample Review Sample Particle location Sample information Sample ID: ' Standard: Partrde type In'.fnvlmn configuration mm Sample results Approval reference: Overall approval: Code: N (B2918/C608/I MO/NO) Classification Table Particle Table Maximum Approval U Ee3 Dfl Flexible for Evaluation and Revision The CIX100 system combines powerful, easy-to-use tools to revise inspection data with a fast, guided particle review. The one-click reclassification function provides flexibility and supports international...

Inspection Data at a Glance All particles, classification tables, the overall cleanliness code, the particle location, and the standard used appear in one view for efficient analysis. Thumbnail images of all particles, or a selected particle subset, are sorted by size. Contaminants are linked with their locations and dimensions, so selecting a thumbnail automatically drives the system to this contaminant for further analysis or post processing. Classification and particle tables show the results according to the selected standard. The component cleanliness code (CCC) and the approval limit are...