BX53M/BXFM System Microscope Advanced Microscopy Simplified

Designed for Industrial and Materials Science Applications Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with PRECiV™ software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

Advanced Microscopy Simplified User-Friendly Simplified and guided operation of the microscope settings makes it easier adjust and reproduce system settings. Functional Designed for traditional industrial microscopy, the BX3M has expanded functionality to meet a broader range of applications and inspection techniques. Precision Optics We have a long history of producing quality optics, providing superior images both in the eyepieces and on the monitor. Fully Customizable Modular design gives you the flexibility to build a system that meets your specific needs.

Intuitive Microscope Controls: Comfortable and Easy to Use When performing inspection tasks, it often takes a long time to adjust the microscope settings, acquire the image, and make the necessary measurements to satisfy reporting requirements. You may need to invest time and money for professional microscope training, or work with limited knowledge about a microscope’s full potential. The BX3M microscope simplifies complex microscopy tasks through its well-designed and easyto-use controls. You can get the most out of the microscope without the need for extensive training. The microscope’s easy,...

Intuitive Microscope Controls Focus Scale Index: Find the Focus Quickly Using the proper aperture stop and field stop settings provides good image contrast and makes full use of the objective’s numerical aperture. The legend guides you to the correct setting based on the observation method and objective in use. The focus scale index on the frame supports quick access to the focal point. Operators can roughly adjust the focal point without viewing the sample through an eyepiece, saving time when inspecting samples that are different heights. Incorrect position Correct position Light Intensity...

Functionality for a Range of Inspection and Analytical Tasks The BX3M series maintains traditional conventional microscopy contrast methods, such as brightfield, darkfield, polarized light, and differential interference contrast. As new materials are developed, many of the difficulties associated with detecting defects using standard contrast methods can be solved using advanced microscopy techniques for more accurate and reliable inspections. New illumination techniques and options for image acquisition within PRECiV image analysis software give you more choices of how to evaluate your samples...

Instant MIA: Easy Panoramic Imaging EFI: Create All-in-Focus Images You can now stitch images easily and quickly just by moving the XY knobs on the manual stage; no motorized stage is necessary. PRECiV™ software uses pattern recognition to generate a panoramic image giving users a wider field of view than a single frame. The Extended Focus Imaging (EFI) function within PRECiV software captures images of samples whose height extends beyond the objective’s depth of focus and stacks them together to create one image that is all in focus. EFI can be executed with either a manual or motorized Z-axis...

Advanced Measurement Routine or Basic Measurement Various measurement functions are available through PRECiV software so that the user can easily obtain useful data from the images. For quality control and inspection, measuring features on images is often required. All levels of PRECiV licenses include interactive measurement functions such as distances, angles, rectangles, circles, ellipses, and polygons. All measured results are saved with the image files for further documentation. Object detection and size distribution measurement are among the most important applications in digital imaging....

Advanced Sample Capacity View More Sample Types and Sizes The 150 × 100 mm stage provides a longer travel in the X direction than previous models. This, together with the flat-top design, enables large samples or multiple samples to be easily placed on the stage. The stage plate has tapped holes to attach a sample holder. The larger stage provides flexibility to users by enabling them to inspect more samples on one microscope, saving valuable lab space. The stage’s adjustable torque facilitates fine positioning under high magnification with a narrow field of view. Flexibility for Sample Height...

Wavefront Aberration Control When using a microscope for advanced research or system integration, optical performance must be standardized for all objectives. Our UIS2 objectives go beyond conventional numerical aperture (NA) and working distance (WD) performance standards by providing wavefront aberration control that minimizes the aberrations that lower resolution. LED Illumination The BX3M utilizes a high-intensity white LED light source for both reflected and transmitted light. The LED maintains a consistent color temperature regardless of intensity. LEDs provide efficient, long-life illumination...

Applications Reflected light microscopy spans a range of applications and industries. These are just a selection of examples of what can be achieved using different observation methods. Darkfield / MIX with Brightfield IC pattern on a semiconductor wafer Fluorescence / MIX with Darkfield Photoresist residue on a semiconductor wafer Transmitted Light / MIX with Brightfield LCD color filter Transmitted Light Darkfield is used to observe scattered or diffracted light from a sample. As only things that are not flat reflect this light, imperfections clearly stand out. Inspectors can identify even...

Choose the Configuration for Your Needs Six BX53M suggested configurations provide the flexibility to select the system that best meets your needs. Easy set up with basic features Simple to use with versatile upgrades : Standard : Option Microscope frame Observation method R-BF :Brightfield (Reflected) T-BF :Brightfield (Reflected/Transmitted) DF :Darkfield DIC differential interference contrast/Simple polarization MIX :MIX FL :Fluorescence IR :Infrared POL :Polalization * T-BF can be used when selecting a "Refrected/Transmitted microscope frame. Reflected or Reflected / Transmitted Simple illuminator...