Spi-EL-HR-M™ Electroluminescence Cell Tester High Resolution Inspection for Solar Cells he Spi-EL-HR-M is a stand-alone bench top tester that uses electroluminescence (EL) to identify microcracks and other physical defects in solar cells. The tester utilizes cooled near-infrared CCD camera technology to image each solar cell with a resolution as fine as 170µm per pixel. Capture time is adjustable between 10ms to 10 seconds. The unique design makes electroluminescent solar cell inspection simple: open the drawer, place the solar cell inside and close the drawer. The system automatically contacts the solar cell, applies power, and acquires a high resolution electroluminescent image. The EL-HR-M is an ideal tester for off-line production or for R&D environments where periodic testing is required. F E AT U R E S A N D B E N E F I T S Improves line yield by identifying defective cells before module assembly Reveals invisible defects such as microcracks, finger defects, and dark areas Fast off-line inspection for immediate results Highest available resolution Easy to use with integrated PC control Test fixture for additional cell formats and sizes available upon request All images stored to on-board PC with time stamp for easy access Compact design fits easily onto any desktop w w w.spiresolar.com ©2014 Spire Corporation. All rights reserved. Specifications are subject to change without notice.

Spi-EL-HR-M™ Cell Tester System Specifications Optical Resolution Configuration High (170 µm / pixel) Bench Top Cell Size Cooled NIR-CCD 1.4M Pixel Computer controlled voltage & current 24 V max, 20 A max 675mm height x 360mm width x 515mm length Power Consumption