SPI-EL™ Electroluminescence Solar Module Testers Manual Inspection System for Solar Modules he SPI-EL series of solar module testers uses electroluminescence (EL) measurements to identify microcracks and other invisible defects in modules. The testers utilize cooled nearinfrared (NIR) CMOS camera technology to image each solar cell with resolutions from 11 Mpixel for Manual Image Processing up to 60 Mpixel for Semi- Automatic Image Processing software. Spire stand-alone EL systems can be easily integrated into any environment from R&D lab use to small volume production. Systems incorporate a user-friendly computer interface which displays all defects to the operator. Example of module with defects, revealed by electroluminescence imaging F E A T such E S A N finger E N and I T S Reveals invisibReveals invisible defectsU R as microcracks,D Bdefects E Flow-current output areas in modules Reveals invisible defects such as microcracks, finger defects and low-current output areas in modules Improves line yield by identifying defective modules prior to lamination Improves quality and reliability of final product Exceptional optical resolution in its class Flexible system configuration allows testing of framed or unframed modules, before or after lamination Small system footprint minimizes floorspace requirements w w w.spiresolar.com ©2014 Spire Corporation. All rights reserved. Specifications are subject to change without notice.

Manual SPI-EL™ Electroluminescence Solar Module Testers