SPI-EL? Electroluminescence Solar Module Testers

Product catalog summary

Introduction
The document discusses the SPI-EL™ Electroluminescence Solar Module Testers, a system designed for the inspection of solar modules to identify defects that are not visible to the naked eye.

Key Features and Benefits

Defect Detection: The system reveals invisible defects such as microcracks, finger defects, and low-current output areas in solar modules.
Quality Improvement: By identifying defective modules before lamination, the system improves line yield and enhances the quality and reliability of the final product.
Optical Resolution: Offers exceptional optical resolution within its class, utilizing cooled near-infrared (NIR) CMOS camera technology.
System Flexibility: The configuration allows for testing of both framed and unframed modules, either before or after lamination.
Space Efficiency: The system has a small footprint, minimizing floor space requirements.

Technical Specifications

The system uses electroluminescence (EL) measurements to identify defects.
Camera resolutions range from 11 Mpixel for manual image processing to 60 Mpixel for semi-automatic image processing.

Usability

The system is user-friendly, with a computer interface that displays all detected defects to the operator.
It can be integrated into various environments, from R&D labs to small volume production settings.

Conclusion
The SPI-EL series provides a comprehensive solution for improving the quality and reliability of solar modules by effectively identifying and addressing defects early in the production process.

Catalog excerpts

SPI-EL? Electroluminescence Solar Module Testers-1

SPI-EL™ Electroluminescence Solar Module Testers Manual Inspection System for Solar Modules he SPI-EL series of solar module testers uses electroluminescence (EL) measurements to identify microcracks and other invisible defects in modules. The testers utilize cooled nearinfrared (NIR) CMOS camera technology to image each solar cell with resolutions from 11 Mpixel for Manual Image Processing up to 60 Mpixel for Semi- Automatic Image Processing software. Spire stand-alone EL systems can be easily integrated into any environment from R&D lab use to small volume production. Systems incorporate a user-friendly computer interface which displays all defects to the operator. Example of module with defects, revealed by electroluminescence imaging F E A T such E S A N finger E N and I T S Reveals invisibReveals invisible defectsU R as microcracks,D Bdefects E Flow-current output areas in modules Reveals invisible defects such as microcracks, finger defects and low-current output areas in modules Improves line yield by identifying defective modules prior to lamination Improves quality and reliability of final product Exceptional optical resolution in its class Flexible system configuration allows testing of framed or unframed modules, before or after lamination Small system footprint minimizes floorspace requirements w w w.spiresolar.com ©2014 Spire Corporation. All rights reserved. Specifications are subject to change without notice.

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