Stack pollution monitoring: Multi-gas Infra Red Fourier Transform (FTIR) Analyzer
2Pages

{{requestButtons}}

Catalog excerpts

Stack pollution monitoring: Multi-gas Infra Red Fourier Transform (FTIR) Analyzer - 1

Multi-gas Infra Red Fourier Transform (FTIR) Analyzer PROCESS & EMISSIONS MONITORING SYSTEMS One single analyzer for the measurement of: HCl, NO, NO2 (NOx), N2O, SO2, CO, CO2 , HC, CH4 (TOC), HF, N2O, O2 ,H2O, NH3... SPECIFIC FEATURES: B ased on a leading edge technology for simultaneous, multi-gas measurement of: HCl, NO, NO2 (NOx), SO2 , CO, CO2 , HC, CH4 (TOC), NH3 , HF, H2O... F ast and simultaneous measurements of up to 50 parameters E specially designed to measure wet and corrosive sample gases, including trace concentrations P erfectly suited for hot/wet measurement of soluble gases such as HCl, HF, NH3 E xcellent calibration stability A utomatic correction of spectral interferences U nmatched accuracy and reliability R ugged & insensitive to vibrations L ow maintenance required 1 80°C heated sample line / measurement cell (in association with HOFI sampling system according to the application), ensuring no sample loss or composition changes I ndustrial PC with Windows based eSAM FT software for on-board data acquisition and processing T OC measurement by FID possible, using the complementary Graphite 52M analyzer MAIN APPLICATIONS: Municipal, Industrial, Hospital waste incinerators Biomass, Cement Kilns, Pulp & Paper, Glass Plants DeNOx (SNCR, SCR) applications Power & Combustion COMPLIANCE WITH IED 2010 APPLICATIONS MIR FT rack cabinet MCERTs CERTIFIED

Open the catalog to page 1
Stack pollution monitoring: Multi-gas Infra Red Fourier Transform (FTIR) Analyzer - 2

PROCESS & EMISSIONS MONITORING SYSTEMS (*) par mesure FID Expressed in mg/m3 or % when indicated. Other ranges available upon request Fourier Transform Infra Red (FTIR) spectroscopy is based on the absorption of an infra-red beam by the sample gas molecules, which induces vibrational state changes for each molecule at specific frequencies. An IR source emits a polychromatic radiation in the medium infrared, which is sent to a Michelson interferometer. This interferometer consists of a beam splitter and two mirrors placed in nearly orthogonal planes (one being static, the other...

Open the catalog to page 2

All ENVEA catalogs and technical brochures

  1. LAS 5000XD

    2 Pages