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Imaging Devices Next Generation - 12 Pages

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Imaging Devices Next Generation

Catalog excerpts

Imaging Devices next generation The most accurate homogeneity measurement of luminance, chromaticity and polarization UMaster & UMaster-PZ ADVANCED LIGHT ANALYSIS by

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Uniformity Series UMaster description Imaging colorimeters are all based on CCD sensors and generally color filters. The difference between the systems lays in the accuracy, the signal over noise ratio, the spatial resolution and the quality of the imaging optics. UMaster is based on a Peltier cooled CCD sensor with true 16-bit analog digital converter. Four color filters dedicated to each CCD sensor are mounted on a motorized color wheel. A second motorized wheel with flat densities is also available for an automatic adjustment to the source luminance. High Accuracy ELDIM is manufacturing...

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Uniformity Series Data analysis and Software Each UMaster system comes with a powerful, Windows-based software suite created by ELDIM. This software provides extensive instrument control, data acquisition and image analysis capabilities. The software provides also a simple, user-friendly interface to fully automate pre-programmed capabilities. This enables each customer to perform sophisticated measurements and tests in a completely automated way with limited efforts. Display Homogeneity UMaster provides a number of tools to analyze easily the measurements including contour extraction and...

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Uniformity Series Anything that emits light or requires color testing can be quantified in a matter of seconds. Inspection automation User friendly EZCom software provided with UMaster allows quick and efficient measurement, data analysis and evaluation with easy operation. Measurement recipes can be build easily and recall automatically when needed. Many tools are available for data analysis using EZCom software. A panel of OCX component is provided to display and analyze all types of data with custom programming.Automated measurement can be driven using EZCom software as ActiveX...

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Uniformity Series How to obtain color accuracy ? The color measurement according to the CIE 1931 document is an integration of the measured light stimuli characterized by its spectral radiance f(λ) multiplied by each of the CIE 1931 curves reported hereafter. In this way we obtain the quantities X,Y and Z given by: To obtain color accuracy for any “complex” light sources, it is mandatory that the spectral response of the system fit the x’(λ), y’(λ) and z’(λ) at best. A precise computation of the spectral response accuracy requirements can be carried out. If we consider that the error on the...

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Uniformity Series Classic Lens Optical diagram for standard imaging objective (top) and ELDIM objective telecentric on the senor (bottom) Principle of the telecentric lens on the sensor side The imaging optics For accurate measurements the imaging optic plays a key role. Indeed, standard imaging optics suffer from a dependence of the flux with the distance to the object. One basic “solution” is to provide different sets of calibration for the system with all the possibilities of error that can occur. ELDIM uses a much better solution based on telecentric optic on the sensor side. A first...

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Uniformity Series Test patterns measured by UMaster (middle). Marks are correctly resolved up to the third line on all patterns (cf. right). It is not the case with a commercial optic (cf. left). MTF and distorsion The MTF (modulation transfer function) of the sensor is the modulus of the Fourier transform of the PSF (point spread function).The better the equipment is and the smaller the image of a punctual source (PSF) is which means the larger the MTF is. To say it differently the cut off frequency of the MTF needs to be as high as possible. This characteristic of the sensor is directly...

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Uniformity Series MURA Defect detection MURA defect detection requires a high quality sensor since it has to challenge the eyes sensibility which is in many aspects very high. In this respect, UMaster is certainly the most sensitive solution of the market thanks to its cooled CCD sensor, high quality optics and high transmission filters. The other difficult task is to automatically analyze, quantify and classify the MURA defects. ELDIM provides in option a full automated solution EZMURA for this task. The software performs automatically the following operations: Basic algorithms Mura...

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Uniformity Series Imaging polarization Light can have different states of polarization. It can be randomly polarized (or unpolarized). This is generally the case of natural light. It can be also linearly polarized. In this case the electric field is oscillating always in the same plane. In any case the electric field characterizing any light wave can be separated in two components: Definition of elliptic parameters of polarized light The polarized component can be defined by its elliptical coefficients (ellipticity ε and orientation α) as shown hereafter. Unpolarized light component is...

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Uniformity Series LED displays always suffer from a lack of uniformity because of the dispersion of the LED characteristics. ELDIM provides a completely automated solution LWAP to calibrate LED display modules in an absolute way. Absolute color measurements are made for each type of LED separately. The software finds automatically all the LEDs on the panel and extracts their color and luminance. It is necessary to define the geometry of the pixel for the calculation of calibration coefficients. One red, one green and one blue LEDs are at least necessary but an additional white LED can be...

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Uniformity Series UMaster comes with a complete software solution for measurement and data analysis. Some characteristics of the EZCom 6 sofware package for UMaster Features

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Uniformity Series Outer dimension (unit mm) U300.4 (*l) The accuracy is guarantied for any type of color stimuli in contrast to competitors that generally guaranty only reference white. (*2) For a radiance level higher than l0mW/Sr/m2/nm (*3) For a luminance higher than 50Cd/m2.This repeatability is given for full resolution. When a binning level N is used it is divided by a factor of N2.With standard CCD sensor and for a resolution of 375x250 the luminance repeatability is only ±0.03% ! (*4) Measurement times are highly dependent on the target and on the conditions. Given times are for a...

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