S500 Functional Test Solution
Open the catalog to page 1S500 Functional Test Solution Complete functional test solution Flexible architecture ► Application specific / general purpose Multiple applications ► Universal graphical interface ► Interactive user instructions for ► Industry standard software tools ► LabVIEW / LabWindows / TestStand Long term support ► Multiyear warranty available ► Integrated system self test ► Full calibration services *LabVIEW, LabWindows and TestStand are trademarks of National Instruments Corporation For your local office details please visit our website: www.diagnosys com
Open the catalog to page 2System overview S500 is a scalable functional test solution. It is specifically designed to provide a rapid and reliable pass / fail decision on the working state of any electronic assembly or circuit board. The S500 test system is designed to use commercially available parts where possible to provide cost effective solutions and protection from obsolescence. Meets or exceeds the technical requirements of the application Is easy to learn and operate Can be integrated and rapidly accepted into demanding environments Already accepted and in use, the S500 is recognized Low maintenance / full self...
Open the catalog to page 3S500 will give a rapid analysis on the pass / fail status of any electronic module or circuit. Utilizing an application test program that runs on an embedded computer controlling all the test capabilities of the S500 system, comprehensive fault coverage is achieved. Application Test Programs (TPS) are written by a team of highly skilled and experienced Application Engineers. The system gives a pass / fail decision correctly and reliably. The likely area of the fault is identified to a small group of electronic components called an ambiguity group. A major benefit of S500 is its unique ability...
Open the catalog to page 4S500 with PinPoint This example shows an S500 test system that has been specifically designed for the test of door control modules on high speed rail cars. The failure information and ambiguity group information is then stored in the Test Results Server where it is retrieved by the PinPoint system. The PinPoint system uses the information to automatically guide the operator to the cause of the failure. Obsolescence replacement S500 is also ideally suited to replace and consolidate obsolete test systems. Recognizing the benefits of a commercially produced test system, OEM’s have acknowledged that...
Open the catalog to page 5Some examples of applications: ► High voltage S500 test system ► Designed to test Auxilliary Power Unit on railcars Doppler radar S500 test system ► Designed to test Doppler radar systems S500 is a flexible and configurable test platform For your local office details please visit our website: www.diagnosys.com
Open the catalog to page 6Self test The S500 test solution is more than just hardware. Designed Every S500 test system is accompanied by an extensive self- and configured using industry standard components, it is test package. This consists of a test program and adaptor. complemented by specially designed modules where necessary. The self-test package is customized to each S500 configuration The user environment can be tailored to meet individual and provides an in-depth test of the hardware and software. customer requirements while maintaining a consistent use This gives confidence in the systems functionality. The software...
Open the catalog to page 7► Examples of graphical user interface ► Test program execution with clear pass / fail indication for each test and final result S 500 User Options Test Program Test & System Logs Test System Vi Load Test Program P2 Edit 'Vie;'. Test Limits Test System Clock View Typical Test Time View Fixture Wiring View User Manual View Schematic Place the Non-ATC TOD B08102G01 to TOD Cradle S5003104. Connect the following cables from iConl S50Q3153 of ITA3 to their ► Intuitive user interface ► Online, interactive user information Contact your local office, visit our website for details: www.diagnosys.com Diagnosys...
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