Catalog excerpts
The X-Card2 Series is an enhanced product family of liner array X-ray detector boards for Industrial and Security applications including Food and Pharmaceutical Inspection and Industrial Non-Destructive Testing (NDT). The X-Card2 provides improved imaging performace with lower dark image noise and increased dynamic range and sensitivity. Detectable X-ray energy range: 20KeV - 160KeV Active length options for 51.2 mm and 102.5 mm Pixel size options: 0.2 mm, 0.4 mm and 0.8 mm Max readout rate: 1 MHz Dynamic range: > 8000 Improved tolerance to electrostatic discharge (ESD): up to 2K Volts contact discharge Significantly improved radiation hardness Eight gain options supported: 0.25pf - 3.5pf All images © Detection Technology, and Fraunhofer EZRT X-ray detector boards with integrator/multiplexer ASIC Suitable for diverse Industrial and Security applications including Food, Pharmaceutical Inspection and Industrial Non-Destructive testing Increased radiation hardness for longer detector lifespan and reduced life time costs Increased protection against ESD and moisture for ease of handling Industry leading image quality and speed with high performance DT proprietary photodiode and ASIC designs Increased sensitivity and reduced dark image noise for improved image quality Complete subsystems available, including detectors, controllers and software libraries for rapid system development Detection Technology, Inc. | Piisilta 1, 91100 Ii, FINLAND | Tel. +358 8 553 6600 | Fax +358 8 553 6611 | http://www.deetee.com | contact@deetee.com
Open the catalog to page 1General Characteristics 0.4-128G 0.2-256G 0.8-64G 0.8-128G X-ray detector boards with integrator/multiplexer ASIC Detectable Energy Range Scintillator Thickness X-Card Length Pixel Height Pixel Width Note 4) Dynamic range is defined as the saturation signal level divided by the RMS noise in darkness with the default gain setting (feedback capacitance 1 pf) of ASIC. Pixel Pitch Minimun Integration Time Maximum Integration Time Note 2) Phosphor layer thickness is 0.3 mm. Note 3) The minimum integration time is defined as Ckc is set to 4 MHz. X-Card Thickness Active area length X-Card Width...
Open the catalog to page 2All Detection Technology catalogs and technical brochures
-
X-scan ME Series
6 Pages
-
X-panel 2301
2 Pages
-
X-panel 1214i
4 Pages
-
X-GCU
2 Pages
-
X-Scan C01
2 Pages
-
X-Panel 1615
4 Pages
-
Aurora CT
6 Pages
-
X-scan T series
2 Pages
-
X-IM ME3
2 Pages
-
X-Card ME3
4 Pages
-
X-Array series
2 Pages
-
DT X-card DE & SE
2 Pages
-
DT X-Scan C5 series
2 Pages
-
X -Scan M01B series
2 Pages
-
X-Scan H01 series
2 Pages
-
Aurora series
4 Pages
-
X-Scan P01 series
2 Pages
-
X-card2 Series
2 Pages
-
X-Scan F01 series
2 Pages
-
X-Tile
2 Pages
-
x-scan il2-de series
2 Pages
-
X-DAQ
2 Pages
-
X-Scan M series
2 Pages
-
X-Scan F5 Series
2 Pages
-
X-Scan c5 Series
2 Pages
-
X-Scan U Series
2 Pages
-
X-Scan D Series
2 Pages
-
Security Applications
2 Pages
-
X-Scan LCS Series
2 Pages
-
X-card
2 Pages
-
Digital X-Card
2 Pages
Archived catalogs
-
X-Panel 2301 brochure
2 Pages
-
X-Panel 1511
2 Pages
-
X-Scan f5
2 Pages
-
X-CGU
2 Pages
-
X-Scan iL2 DE Series
2 Pages
-
X-Scan iHE2 Series
2 Pages
-
X-Scan U3
2 Pages
-
X-Scan U-Shape
2 Pages
-
X-Scan iHE
2 Pages
-
Photodiode 550 nm | PDC series
2 Pages
-
X-ray detector card X-Card SE-X
2 Pages