X-Card ME3
4Pages

Catalog excerpts

X-Card ME3 Multi-energy X-ray detector board X-Card ME3 is a stand-alone multi-energy detector board designed for linear X-ray imaging systems. It powers a variety of security and industrial applications that require state-of-the-art material discrimination capability yet costeffective architectures in comparison with multi-view and CT systems. For example, it is an ideal solution for meeting the requirements of the EDS CBS C2 standard, making it possible to keep laptops and other personal electronics in the hand luggage during the scan. X-Card ME3 provides up to 128 energy levels enabling extremely precise material discrimination of materials even when they have similar atomic compositions. This improves identification of all solid and liquid materials, reduces the false alarm rate, speeds up passenger throughput at security checkpoints, and provides more accurate material flow analysis in production lines. The energy bins are easily configurable to optimize spectral information for the analysis algorithms. X-Card ME3 comes with carefully selected direct conversion semiconductor material operating at room temperature, and a unique digital signal processing chain. This provides highperformance spectroscopic single photon counting capability that enables the most accurate material discrimination. X-Card ME3 is based on a modular and easily scalable platform. A complete, application-optimized detector subsystem can be built by combining a number of these photon-counting detectors and readout electronics, which enables real-time photon counting and precise photon energy measurement. The detector board contains a 10 cm long array of 128 pixels with a pitch of 800 µm, and can be daisychained to a number of different system configurations.

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BENEFITS • Extremely precise material discrimination capability even for materials with similar atomic compositions • Improves identification of all solid and liquid materials • Reduces false alarm rate • Speeds up passenger throughput at security checkpoints • Makes material flow analysis more accurate in production lines • Energy bins easily configurable to optimize spectral information for the analysis' algorithms • Improved spatial resolution enhances shape recognition in security systems • Compensation of semiconductor crystal instabilities to reduce the warm up time • Count rate...

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