Catalogs >
Detection Technology >
DT X-card DE & SE

DT X-card DE & SE
2Pages

Catalog excerpts

Detection Technology moci/ATmnj rnDCCAiTOii ' ^ “ APPLICATIONS • Security inspection • Multi-view imaging • Non-destructive testing • Food inspection • Raw material sorting • Thickness measurement • Foreign particle detection • CT imaging • Bone densitometry X-Card | The X-Card detector card is a dual-energy linear array X-ray detector card. It has two two-layers of Silicon photodiode arrays, targeted for different X-ray energy ranges. X-ray sensitive scintillant material is located on top of the photodiode arrays to convert X-ray signal in to visible light, which generates current at photodiode. The electrical current signals from photodiodes are connected to inputs of charge-sensitive preamplifier array ASICs. Current is integrated in the read out CMOS chip by charge amplifiers (one for each pixel). All pixels in high-energy and low-energy array are integrated simultaneously. The voltage outputs from charge amplifiers are read out in serial mode through a multiplexing circuitry in the same ASIC. X-DAQ board is typically used to sample the voltage signals and provide processed digital data to a host computer. KEY FEATURES AND BENEFITS • X-Card 1.5,1.6 and 2.5 form an X-ray detector board family, utilizing high performance photodiodes and integrator/ multiplexer ASICs • Advanced features, cost effectiveness, high reliability and easy maintenance for X-ray screening systems • Single energy version as an option • Sensitivity range from 1.5pC to 76.5pC with 51 steps (12 steps enabled by default). Separate sensitivity setting for low energy and high energy detectors • Minimum line integration time 0.2 ms • Differential analog output with maximum read-out rate of 1 MHz (pixels/sec)

Open the catalog to page 1