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INFINITY PLANETARY ION BEAM ETCH SOLUTION

INFINITY PLANETARY ION BEAM ETCH SOLUTION

INFINITY PLANETARY ION BEAM ETCH SOLUTION

Product catalog summary
Infinity Planetary Ion Beam Etch Solution Overview
This document provides an overview of the Infinity Planetary Ion Beam Etch (PSIBE) system, designed for low-to-mid throughput applications in the MEMS, semiconductor, data storage, optics, and lenses markets. It is particularly suitable for pilot production and foundry support due to its small footprint and versatile capabilities.
Key Benefits
  • Low plasma damage etch.
  • Etch rate selectivity for multiple materials using reactive ion etch and chemically assisted etch.
  • Precise endpoint control with a Secondary Ion Mass Spectrometer (SIMS).
  • Accommodates multiple substrate sizes up to 8 inches.
Technical Specifications
  • Bias substrate for low plasma damage etch.
  • Reactive and chemically assisted ion beam etch for material selectivity.
  • SIMS for precise delayering and endpoint control.
  • Three substrate planets for batch production.
  • Automation software for enhanced process control.
  • Short Mean Time to Repair (MTTR) and long Mean Time Between Failures (MTBF) for high system uptime and ease of maintenance.
System Overview
The Infinity PSIBE system features an advanced ion beam source, optional integrated SIMS for endpoint detection, and automatic layer termination software. It supports high-performance etching, thin film profile milling, and glancing angle milling. The system is compatible with class 1000 cleanrooms and is ESD compliant. It offers adjustable incidence angles for fine-tuning etch selectivity.
Configuration Options
  • SIMS module for 150mm or 200mm planets.
  • Large area ion source.
  • Single wafer load lock, cassette load lock, or cluster tool front end.
Applications
  • Semiconductor process yield improvement with endpoint control.
  • Compound semiconductor Au etch.
  • Process control and chip design assessment.
  • Patterned etch.
  • FBAR and SAW device trimming for frequency control.
Graph Analysis
The document includes a graph showing the relationship between incidence angle and etch selectivity, highlighting a point of inflection for materials such as SiO₂ and AI.
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Catalog excerpts

INFINITY PLANETARY ION BEAM ETCH SOLUTION-1

INFINITY PLANETARY ION BEAM ETCH SOLUTION TECHNICAL SPECIFICATION SHEET This flexible, versatile PSIBE is a batch system that is designed for low-to-mid throughput applications. It features a small tool footprint and is a perfect solution for the MEMS, semiconductor, and data storage markets as well as optics, lenses, pilot production and foundry support. BENEFITS INCLUDE: • Low plasma damage etch • Etch rate selectivity for multiple materials by reactive ion etch and chemically assisted etch • Precise end point control with SIMS detector. • Able to accommodate multiple substrate sizes up to 8" Bias substrate Low plasma damage etch Reactive ion beam etch Material etch rate selectivity Chemically assisted ion beam etch Material etch rate selectivity Secondary ion mass spectrometer Precise delayering and end point control Three substrate planets Batch production Small footprint Automation software Enhanced process control Short MTTR/Long MTBF High system uptime and ease of maintenance 1259 North Church Street, Bldg 3, Moorestown, NJ USA 08057 | 1-800-666-6004 [email protected] | www.dentonvacuu

 Open the catalog to page 1
INFINITY PLANETARY ION BEAM ETCH SOLUTION-2

SYSTEM OVERVIEW The Infinity PSIBE System features an industry-leading ion beam source, an optional integrated Secondary Ionization Mass Spectrometer (SIMS) for endpoint detection, advanced Semiconductor Layer Stop Technology (SLST) and automatic layer termination software delivering full computer control. The Infinity PSIBE system delivers high-performance etching, critical thin film profile milling, glancing angle milling and more. It enables cost-effective manual sample transfer with a single wafer load lock. The system is class 1000 cleanroom compatible (ballroom style) and ESD compliant,...

 Open the catalog to page 2
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