Catalog excerpts
SURFACE INSPECTION FOR METALIZED FILM AND RAW MATERIAL I DeCoSystem PRINTINSPECTIONMACHINES DIFFERENT APPLICATION FOR SURFACE INSPECTION Thanks to its highly modular configuration INSPECTOR can be easily integrated into any production line. It is possible to configure the web width and the appropriate illumination for each different application. The integration directly into the metallizer guarantees an immediate alarm in case of problem or bad material and helps in the waste reduction. BENEFITS INspEcToR is used either to detect and classify defects or to improve the process and increase the productivity. When a defect is found, the operator is alerted and the type of defect is logged in order to provide a detailed report for each roll. Inspector ensures high levels of quality and offer the best solution for your production processes and converting operations maximizing yield, productivity, and quality.The defect information and images stored in our database are used in many ways. Reports, charts, and graphs can be tailored for every need. Defect information can be used to grade, sort, or reject material. QUALITY IS EASY Thank to its highly modular configuration Inspector can be easily integrated into any production line. It is possible to configure the web width and the appropriate illumination for each different application. The integration directly into the metallizer guarantees an immediate alarm in case of problem or bad material and helps in the waste reduction.
Open the catalog to page 1TECHNICAL FEATURES INSPECTOR has a very intuitive operator interface with a fast setup and a really powerful defect detection software. Standard features are the following: o Modular CAMERA CONFIGURATION up to eight cameras o LED Lighting SYSTEM with three different light sources o TOUCH SCREEN INTERFACE o Easy TO LEARN AND Easy TO USE GUI INTERFACE o FAST AND AUTOMATIC SET UP new job can be started in a minute o DIFFERENT DISPLAY MODES defect detection and defect history o POSSIBILITY TO ANALYzE THE DEFECT HISTORY during defect detection o OD MEASUREMENT AND REAL TIME DISPLAY of OD...
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