Q-400 µDIC - Optical, non-contact measurement system for microscopic shape, displacement and strain measurement. Q-400 μDICTM Microscopic Shape, Displacement & Strain Measurement Applications • Warpage measurement • CTE determination FEA Validation • Best for micro-electronic components • Features • 3D shape, deformation and strain measurement • Optical, non-contact measurement method Fast, accurate online visualization of results • Small, microscopic samples < 17 x 17 mm² • • All-in-one system with thermal load Solution The Q-400 µDIC system is specially designed for measurement of warpage and thermal expansion within the micro-electronics/components industry working with electronic miniaturization and high-density package design. The solution helps to measure the precise deformation in cases where simulations are not possible or simply just a necessity. The solution comes as a complete system with stereo microscope, illumination, heating/ cooling stage, 5 megapixel cameras and user friendly me

Easy and fast FEM validation and CTE determination thru real-time image correlation of shape, deformation and strain with sub-micron accuracy. Both setup, focusing and calibration are easy and smooth allowing you to focus on what really matters: 3D warpage measurements that have never been easier. The system provide easy and fast full-field, 3D deformation and strain analysis. The results include complete shape, deformation and strain data, temporal and spatial plots, data of virtual strain gauges, STL data for CAD processing as well as images and movies for presentation purposes. General Specifications...