Argus- Ceph / Pan CCD-TDI Scanning X-Ray Detector Argus is a scanning X-ray detector platform for dental panoramic, cephalometry, mammography and general radiography applications. Key Features • EMS fabrication for high M resolution and large FOV • lexible and robust modular form F factor • High dynamic range • Low sensor readout noise • thernet interface for ease of E integration • 16 bit ADC • Anti-blooming • Custom scintillator options Typical Applications • Dental Panoramic • Dental Cephalometric • Mammography • Veterinary • Scientific • Pharmaceutical Inspection Argus scanning X-ray detectors include high resolution scintillator technology and standard Ethernet connectivity, allowing images to be ported directly to a computer for processing. Argus utilizes our radiation hard sensor fabrication process to ensure longevity and image quality that is immune to X-ray radiation degradation over time. This means you will be able to acquire the same high quality images over and over, and get consistent results over the lifetime of your modality. Argus also uses the latest advancements in MEMS technology to maintain the typical gap between individual image sensors in assembly close to default pixel size. This also benefits our detectors in terms of planarity, so that the same high image quality is maintained throughout the whole field of view of the detector. Pixel Size Active Area Resolution Dynamic Range MTF: 54 μm effective 221 x 6.9 mm 4080 x 128 8 lp/mm typ. 80 dB 0.2 @ 5 lp/mm All Argus Models ADC Line Rate Charge Transport Image Memory Data Interface Communication 16-bit (65,536 levels) 2kHz 4 phase 46MB GigaBit Ethernet Web GUI / API Pixel size options available by on-chip binning: 54, 81, 108, 135, 162 μm Analog gain up to 6x is available by camera hardware

Argus- Ceph / Pan CCD-TDI Scanning X-Ray Detector Argus-Ceph and Argus-Pan are designed for cephalometric and panoramic extra-oral dental X-ray applications. Argus Image * Notes: 18 lp/mm nyquist limit with 27|jm pixel, Measured contrast 10% at 15 lp/mm* hi9h resolution scintillator, area mode, FFC on 35keV 5 lp/mm 10 lp/mm 15 lp/mm 20 lp/mm Time Delay & Integration (TDI) is based on line scan technology and provides dramatically increased responsivity compared to other scanning methods. TDI line scan delivers an unmatched combination of sensitivity and speed by accumulating multiple exposures...