COSMICSEMICONDUCTOR SOLUTIONS NEW-GEN, HIGH THROUGHPUT ATE CONFIGURABLE FOR COMPLEX SMART POWER DEVICES, SIC, AND GAN POWER DISCRETE PRODUCTS New-gen Automatic Test Equipment configurable for Si, SiC and GaN power products; high side and low side Driver ICs, IGBT, Power MOSFETs, Power ICs. The VIP Ultra is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs. Designed for cleanroom integration, it delivers exceptional parallel performance metrics, scaling from 48 sites at 80 V and 250 A to 16 sites at 4 kV and 250 A, ensuring ultra-high throughput with minimal footprint and low total cost of ownership. Its versatile configurations include DCS sources (±80 V, ±4 A across up to 48 channels), programmable DC load sinks/sources (±250 A on 48 channels), 320 digital lines (0-5.5 V, 50 mA with DSIO memory and per-channel PPMU), 48 time-measurement units, 48 LCR meters, 64 PPMUs, and Picoammeter accuracy down to 20 pA. Lowest TCO for power products Ultra-highthroughput Minimumfootprint

These resources enable a comprehensive suite of DC and energy-stress test capabilities. Measuring 647 x 638 x 702 mm, VIP Ultra's compact form fits seamlessly within existing probers and handlers. Launched at APEC 2025, it has been recognized as “Product of the Month" by Bodo's Power Systems, solidifying its status as a leading solution for wide-bandgap semiconductor testing. In summary, VIP Ultra combines unmatched scalability, compact design, and exhaustive test functionality across all power-device categories-offering manufacturers a superior tool for maximizing throughput, efficiency, and...