ATE CONFIGURABLE FOR LOW-VOLTAGE SILICON POWER PRODUCTS Automatic Test Equipment configurable for low-voltage silicon power products; high-side and low-side Driver ICs, IGBT, Power MOSFETs, Power ICs. OVERVIEW VIP Extended is a highly configurable ATE system designed for parallel testing of silicon-based, SiC, and GaN devices, including high-side/low-side drivers, IGBTs, power MOSFETs, and power ICs. Engineered for use in wafer sort, strip test, pick & place, and gravity handler environments, the system supports up to 48 parallel test sites for parameters such as Rg, Cg, and UIS, ensuring high device throughput (UPH) and reduced test costs. The system includes up to 48 four-quadrant DC resources (±80 V, ±4 A), 48 programmable current sink/ source channels up to ±250 A, 320 digital channels with low level 0V, high level from 2.3V to 5.5V @50mA current capability 2 M vectors pattern memory and up to 192 floating digital drivers. High UPH for wafer sort and strip test 48 x site parallel test for Rg, Cg and UIS Lowest COT for power products

Timing measurements are handled by a 48-channel TMU, in addition to up to 48 LCR meters, 64 PPMUs, 48 picoammeters (with 20 pA accuracy), and 48 inductive/resistive loads. All components are housed in a compact cabinet (350 x 600 x 640 mm), making VIP Extended ideal for integration into production lines. VIP Extended is designed to provide modularity across multiple test configurations, adapting to specific device requirements while reducing cost per test through resource density and operational flexibility. It supports applications across automotive, consumer, industrial, aerospace, and MEMS...