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UltraFlat™

UltraFlat™

UltraFlat™

Product catalog summary
Overview
The Tropel® UltraFlat™ 200 Mask System, produced by Corning Tropel Corporation, is engineered for the photomask industry to provide ultra-precise flatness measurements of substrates, mask blanks, and photomasks. It is essential for meeting the stringent flatness specifications required for smaller device features.

Specifications
  • Measurement Method: Near Normal-Incidence Interferometry
  • Performance: Measurement uncertainty of 6 nanometers and a dynamic range of 10 micrometers
  • Mask Sizes: 6 inches (6025, 5009, and others available upon request)
  • Measured Data Points: 1,000,000 per measurement
  • Measurement Time: 30 seconds
  • Standard Measurements: Front referenced flatness, local slope, stress, microwaviness, x-y polyfit
  • Data Analysis: 3-D, contour, isometric, histogram, and site plots, site analysis

Data Management
  • Data Storage: 80 Gb hard drive
  • Communications: 10/100-BaseT Ethernet
  • Operating System: Windows® XP

Dimensions and Weight
  • Interferometer Housing and Base: 89 cm x 117 cm x 132 cm (35 in x 46 in x 52 in), 400 kg (880 lb)
  • Computer Workstation: 66 cm x 66 cm x 168 cm (26 in x 26 in x 66 in), 34 kg (75 lb)

Options
  • Fully automated Class 1 chamber
  • Robotic mask handling and sorting

Compliance and Standards
The system is NIST traceable and conforms to SEMI standards, ensuring reliable and standardized measurements.

Contact Information
For further details, contact Corning Tropel Corporation at 60 O’Connor Road, Fairport, New York 14450, Tel: +1-585-388-3500, Fax: +1-585-388-3414, E-mail: [email protected], Website: www.corning.com/metrology
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Catalog excerpts

UltraFlat™-1

The Tropel® UltraFlat™ 200 Mask System provides unprecedented flatness measurements of photomasks. Manual handling, fully automated robotic handling, and Class 1 clean room environment options are available. The Tropel® UltraFlat™200 Mask System, manufactured by Corning Tropel Corporation, is designed specifically for the photomask industry. Its low measurement uncertainty makes the UltraFlat System the perfect tool for today’s ever-tightening mask flatness specifications. The push for smaller device features requires that photomasks be extremely flat. The UltraFlat System is used to measure flatness ofphotoblanks and photomasks throughout every stage of the manufacturing process, including, polishing, coating, patterning, pellicle mounting and analyzing the effects film stress. The UltraFlat system utilizes nearnormal incidence interferometry, rock solid structural design, state-of-the-art optics and Corning Tropel's renowned phase shifting analysis software; delivering up to 6 nm measurement uncertainty. The system is NIST traceable and provides measurements that conform to SEMI standards. An automated photomask handling and measurement configuration and clean room option are also available.

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UltraFlat™-2

Measurement method Near Normal-Incidence Interferometry 6 nanometers 10 micrometers < 6 inches (6025, 5009 and other available upon request) < 1,000,000 per measurement < 30 seconds Front referenced flatness, local slope, stress, microwaviness, x-y polyfit 3-D, contour, isometric, histogram and site plots, site analysis Performance Uncertainty1 Dynamic range2 Mask sizes Measured data points Measurement time Standard measurements Data analysis Data Management Data storage 80 Gb hard drive Operating system Windows XP Interferometer housing and base 89 cm x 117 cm x 132 cm (35 in x 46...

 Open the catalog to page 2
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