Measuring complex, high-precision parts with multiple surfaces is usually done with contact profilers. Contact gages are slow, collect small amounts of data and typically require complicated programming. But now, with the FlatMaster MSP (Multi Surface Profile), a non-contact frequency scanning interferometer, multiple surfaces (with up to 300 millimeters of separation*) are simultaneously measured in just seconds. Hundreds of thousands of data points are collected and analyzed, providing complete surface characterization for flatness, parallelism, and height/depth with sub-micron accuracy. The FlatMaster MSP can measure parts up to 300 mm diameter, on a variety of materials and surface finishes. * FlatMaster MSP 150 and 300 Key Benefits ■ improves product quality, manufacturing yield and throughput ■ Lowers manufacturing costs ■ increases process awareness and understanding ■ Reduces time-to-market ■ increases customer satisfaction Powerful ■ High resolution and accuracy on multiple surface at multiple heights over the entire measurement range ■ Large dynamic range ■ Fast measurements, independent of measured range or number of surfaces ■ Excellent reproducibility results from operator to operator Flexible ■ Measures multiple surfaces simultaneously ■ Measures a variety of material types ■ Measures a wide range of surface finishes Easy to Use ■ Place the part and measure, little or no fixturing required ■ intuitive recipe driven operation ■ Suitable for production, quality control, or development environm

Field of view Z-Resolution Lateral resolution Measurement range (Z-Axis) Measurement method Measurement time Measured data points Materials Surfaces Frequency Scanning Interferometry 30 seconds typical up to 3.1 million per measurement Metals, glass, polymers, ceramics, and many others Fine-ground, lapped, polished, super-finished and others * Refers to instrument limited Accuracy and Repeatability (0) as based on measurement of traceable artifact ** Depth/Height Tropel Metrology Software (TMS™) Standard Parameters User-defined Report Layouts Data Management Flatness, depth/height, parallelism,...