General Information
Comex CMA-9 Multi-Channel Analyzers are designed for measuring particle size distributions ranging from 0.1 to 1000μm in both wet and dry conditions. They are suitable for industrial applications such as minerals, coatings, cement, and pharmaceuticals. The analyzers use advanced laser diffraction technology and are robustly constructed for long-term use in heavy industrial environments. The software is flexible, allowing data presentation in various formats and integration with production systems.

Operating Principle
The CMA-9 operates on the laser diffraction principle, which measures particle size based on the diffraction patterns of a laser beam. This method is effective for particles from nanometres to millimetres. The system is unique in its ability to handle high particle concentrations without requiring significant dilution, thanks to a special multi-particle scattering model.

Multichannel Solutions
The CMA-9 supports both dry and wet applications with multichannel capabilities, allowing for sequential sampling and measurement across multiple production channels. This optimizes instrument use and reduces costs.

Dry and Wet Operating Modes
In dry mode, sampling devices can be installed in pressurized pipes or free-falling material streams, with pneumatic transportation of samples. Wet mode requires careful handling of slurry samples, with automated sampling and measurement processes. Both modes allow for independent sampling and analysis sequences.

Specifications
The CMA-9 features a user interface for setting measurement parameters, including frequency, sequence, and importance levels. It supports measurements from 0.1 to 2500 microns with a +/- 2% accuracy on Dv50. The system is compliant with industrial-grade EMC requirements and operates within a temperature range of 10-70°C. It supports Ethernet connectivity for external PC integration and is CE certified.

Data Presentation and Control
The software provides data tables for external control systems like PLCs, allowing for process adjustments based on particle size measurements. It includes features for defining measurement frequency, sequence, and data storage options. The system can present particle size distribution curves and trend curves for specific parameters.