Tungsten filament SEM microscope
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Tungsten Filament Scanning Electron Microscope

2016 CIQTEK was officially established. CIQTEK launched commercial Scanning Electron Microscope, which was recognized very well by the market. Schottky Field Emission Scanning Electron Microscope was launched. More models SEM2000, SEM3200 and SEM3300 were released, in which SEM3300 broke through the long standing resolution limit of Tungsten Filament Scanning Electron Microscope. In the same year, more than 100 units of Scanning Electron Microscopes were delivered. The High-speed SEM model HEM6000, the Focused Ion Beam Scanning Electron Microscope (FIB-SEM) model DB500 and Ultra-high...

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Tungsten Filament Scanning Electron MicroscopeSimplicity does not compromise functionality SEM2100 is an user-friendly and accessible Tungsten Filament Scanning Electron Microscope (SEM) which is designed for novice users. It features a simplified operating process, adheres to industry standards and user habits in its User Interface design. Despite its minimalist software interface, it provides a comprehensive range of automated functions, measurement and annotation tools, image post-processing management capabilities, optical image navigation, and more. This design concept perfectly...

Successful Customers, Successful Companions Successful Customers, Successful Companions Tungsten Filament Scanning Electron MicroscopeSEM3200High-performance & Universal The SEM3200 is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities....

The microscope supports 2-stage low vacuum modes: 5-180 Pa chamber pressure can be reached without pressure limiting aperture, and 180-1000 Pa is achievable with PLA. The specially designed objective lens vacuum chamber minimizes electron mean free path in low vacuum, maintains the resolution to be at 3 nm @ 30 kV Intermediate Stage of Molecular Pumping Gas Loading in Sample Chamber Differential Vacuum Region Low Vacuum(5-180Pa) G L d. . W . Gas Loading m N—i Sample Chamber " The incident electron beam ionizes the air molecules on top of the surface, producing electrons and ions, in which...

Successful Customers, Successful Companions Successful Customers, Successful Companions Tungsten Filament Scanning Electron MicroscopeSEM3300Next-Generation SEM3300 is a next-generation tungsten filament scanning electron microscope that incorporates technologies such as “Super-Tunnel”electron optics technologies, featured with an inlens electron detector, and an electrostatic & electromagnetic compound objective lens. By applying these technologies into the tungsten filament microscope, the long standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to...

Using a vertically mounted chamber camera to capture optical images for specimen stage navigation allows for a more intuitive and accurate specimen positioning. EBSD has been installed Intelligence Assisted Image Astigmatism Correction Under this mode, the astigmatism value of X and Y varies with the pixels. The Image clarity is maximized at the optimal astigmatism value, enabling rapid stigmator adjustment.

Successful Customers, Successful Companions Improved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction enable one-dick done imaging, enhancing work efficiency

Infrared CCD Real-time monitoring to chamber interior motion, using image recognition and motion capture technology. Manually input the sample height to accurately define the distance between the sample and the objective lens to prevent collisions. Shut off the power to stage motor at the moment of collision to minimize damage. Pre-aligned replacement filament module ready to use Integrated filament module, mechanical alignment free. Remove the electron gun cover, flip open the electron gun head, and manually unscrew the filament housing. If the filament housing is still hot, wait for it to...

Successful Customers, Successful Companions ■ Maximum Field of View exceeds 100 mm2 ■ Support for individual frame image size up to 48k, and stitched images up to eight trillion pixels ■ Patented algorithms for local and macro optimal solutions, achieving the best stitching results (* Patent No.: 202210372676.8) ■ Pre-defined imaging settings for unattended continuous image acquisition and real-time stitching ■ Automatic focusing. Automatic stigmator, and Automatic brightness & contrast adjustment during image acquisition ■ Offline data browsing, stitched images can be imported into other...

The software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. It enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science. ■ Uses Mask-RCNN, an object detection and instance segmentation algorithm that accurately identifies particles in an image without the need for parameter tuning. ■ 4. Utilizes classical watershed algorithm and ensemble contour non-convex cutting method for precise segmentation of adhesive and overlapping...

Successful Customers, Successful Companions = Gradient calculation for all pixels within the selected frame, enabling more precise edge detection, s Multiple edge detection modes, such as line, space, and pitch. Compatibility with various image formats, including TIFF, PNG, JPG, and BMP. Built-in image post-processing functions. Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Supports multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image...