Field Emission SEM4000X
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FESEM SEM4000X Field Emission Scanning Electron Microscope

2016 CIQTEK was officially established. 2019 CIQTEK launched commercial Scanning Electron Microscope, which was recognized very well by the market. 2021 R&D overcame obstacles, and the 1st Schottky Field Emission Scanning Electron Microscope was launched. 2022 More models SEM2000, SEM3200 and SEM3300 were released, in which SEM3300 broke through the long standing resolution limit of Tungsten Filament Scanning Electron Microscope. In the same year, more than 100 units of Scanning Electron Microscopes were delivered. 2023 The High-speed SEM model HEM6000, the Focused Ion Beam Scanning...

Successful Customers, Successful Companions Field Emission Scanning Electron Microscope SEM4000X Stable, Versatile, Flexible, and Efficient. High resolution Multi-detector technology Simplified alignment Built from a higherend platform *Ultra beam deceleration mode The SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra beam deceleration mode to enhance low-voltage resolution even...

01 Retractable Back-Scattered Electron Detector（BSED） * Optional Retractable Back-Scattered Electron Detector（BSED） Mouse brain tissue cells/10 kV BSED-based ECCI mode (Electron Channeling Contrast Imaging) The “Electron Channeling effect” refers to a significant reduction in electron scattering by crystal lattices, when the incident electron beam satisfies the Bragg diffraction condition, allowing a large number of electrons passing through the lattice, thus exhibit a "channeling" effect. For polycrystalline materials with uniformed composition and polished flat surfaces, the intensity of...

Successful Customers, Successful Companions Simultaneously multi-channel imaging via various detectors Great resolution achieved on surface topographic features with in-lens electron detector imaging Good stereoscopic images of morphological features with Everhart-Thornley Detector imaging Atomic number contrast (Z-contrast) image with retractable BackScattered Electron Detector imaging Retractable Scanning Transmission Electron Microscopy (STEM) Detector Incident electrons Automatic insertion and retraction Multiple operating modes Bright-field (BF) imaging High-angle annular dark-field...

01 Advances in CIQTEK electron microscopy technology - more options Energy Dispersive spectrometry

Successful Customers, Successful Companions Specimen Exchange Loadlock * Optional Features： Effectively reduce chamber contamination Linear guiding rail design, drawer-style opening and closing 4-inches（110mmx40mm） 8-inches（208mmx40mm） Trackball & Knob Control Panel * Optional AutoMap * Optional Maximum Field of View greater than 100 mm2 Support single frame resolution up to 48k pixels, and stitched image up to 800 billion pixels Patented algorithms for local and global optimization, achieving optimal stitching effects (*Patent number: 202210372676.8) Preset imaging condition for unattended...

The software employs various target detection and segmentation algorithms, suitable for various types of particle and pore samples. It enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science. Z Uses Mask-RCNN, an object detection and instance segmentation algorithm that accurately identifies particles in an image without the need for parameter tuning. ■ Utilizes classical watershed algorithm and ensemble contour non-convex cutting method for precise segmentation of adhesive and overlapping...

Successful Customers, Successful Companions AutoMeasure * Optional Gradient calculation for all pixels within the selected frame, enabling more precise edge detection. Multiple edge detection modes, such as line, space, and pitch. Compatibility with various image formats, including TIFF, PNG, JPG, and BMP. Built-in image post-processing functions. Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Supports multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various...

Successful Customers, Successful Companions Specifications Specifications Electron Optics Specimen Chamber User Interface 0.9 nm@30 kV, SE 1.2 nm@15 kV, SE 1.9 nm@1 kV, SE 1.5 nm@1 kV( Ultra beam deceleration） 1.0 nm@15 kV( Ultra beam deceleration） Accelerating voltage Schottky Field Emission Electron Gun Optical navigation + chamber monitoring In-lens Electron Detector Everhart-Thornley Detector Retractable Back-Scattered Electron Detector（BSED） Retractable Scanning Transmission Electron Microscopy detector（STEM） Energy Dispersive Spectrometer （EDS） Electron Backscattered Diffraction...

Successful Customers, Successful Companions Email: info@ciqtek.com Website: www.ciqtekglobal.com Address: Building E2, No. 2800. Innovation Ave, Hi-tech Zone, Hefei, Anhui 230088, China