FESEM SEM4000Pro Field Emission Scanning Electron Microscope

2016 CIQTEK was officially established. 2019 CIQTEK launched commercial Scanning Electron Microscope, which was recognized very well by the market. 2021 R&D overcame obstacles, and the 1st Schottky Field Emission Scanning Electron Microscope was launched. 2022 More models SEM2000, SEM3200 and SEM3300 were released, in which SEM3300 broke through the long standing resolution limit of Tungsten Filament Scanning Electron Microscope. In the same year, more than 100 units of Scanning Electron Microscopes were delivered. 2023 The High-speed SEM model HEM6000, the Focused Ion Beam Scanning Electron...

Successful Customers, Successful Companions Field Emission Scanning Electron Microscope SEM4000Pro Analytical SEM with Large Beam I SEM4000Pro is an analytical model of field emission scanning electron microscope (FE-SEM) , which is equipped with a high-brightness and long-life Schottky field emission electron gun. Its 3-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS,EBSD, WDS, and more. It comes standard with a low vacuum mode and high-performance low vacuum secondary electron detector, as well as a retractable backscattered electron detector,...

Under low-vacuum mode, a range of 10-180 Pa can The secondary electron emission from the specimen surface be reached without a pressure limiting aperture. The ionizes air molecules, generates electrons, ions, and photons specially designed objective lens vacuum chamber simultaneously. The generated electrons further on ionize minimizes the electron mean free path in low vacuum other air molecules, low-vacuum secondary electron detector condition, achieves resolution of 1.5 nm at 30 kV under (LVD) captures a large amount of photon signals produced in such process Gas molecules Positive ions Electrons...

Successful Customers, Successful Companions Retractable Back-Scattered Electron Detector（BSED） * Optional Retractable Back-Scattered Electron Detector（BSED） Mouse brain tissue cells/10 kV BSED-based ECCI mode (Electron Channeling Contrast Imaging) The “Electron Channeling effect” refers to a significant reduction in electron scattering by crystal lattices, when the incident electron beam satisfies the Bragg diffraction condition, allowing a large number of electrons passing through the lattice, thus exhibit a "channeling" effect. For polycrystalline materials with uniformed composition and polished...

01 Simultaneously multi-channel imaging via various detectors Great resolution achieved on surface topographic features with in-lens electron detector imaging Good stereoscopic images of morphological features with Everhart-Thornley Detector imaging Atomic number contrast (Z-contrast) image with retractable BackScattered Electron Detector imaging Retractable Scanning Transmission Electron Microscopy (STEM) Detector Incident electrons Automatic insertion and retraction Multiple operating modes Bright-field (BF) imaging High-angle annular dark-field (HAADF) imaging Plant section bright-field imaging...

Successful Customers, Successful Companions Advances in CIQTEK electron microscopy technology - more options Energy Dispersive spectrometry

02 Specimen Exchange Loadlock * Optional Features： Effectively reduce chamber contamination Linear guiding rail design, drawer-style opening and closing 4-inches（110mmx40mm） 8-inches（208mmx40mm） Trackball & Knob Control Panel * Optional AutoMap * Optional Maximum Field of View greater than 100 mm2 Support single frame resolution up to 48k pixels, and stitched image up to 800 billion pixels Patented algorithms for local and global optimization, achieving optimal stitching effects (*Patent number: 202210372676.8) Preset imaging condition for unattended continuous image acquisition and real-time...

Successful Customers, Successful Companions The software employs various target detection and segmentation algorithms, suitable for various types of particle and pore samples. It enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science. • Uses Mask-RCNN, an object detection and instance segmentation algorithm that accurately identifies particles in an image without the need for parameter tuning. - Utilizes classical watershed algorithm and ensemble contour non-convex cutting method for precise segmentation...

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Successful Customers, Successful Companions Specifications Specifications Electron Optics Specimen Chamber User Interface Accelerating voltage Schottky Field Emission Electron Gun Optical navigation + chamber monitoring In-lens Electron Detector Everhart-Thornley Detector Retractable Back-Scattered Electron Detector（BSED） Retractable Scanning Transmission Electron Microscopy detector（STEM） Energy Dispersive Spectrometer（EDS） Electron Backscattered Diffraction Pattern （EBSD Specimen exchange loadlock （4 inch /8 inch） Trackball & Knob Control Panel Duo-Dec mode（Duo-Dec） Ultra beam deceleration...

Successful Customers, Successful Companions Email: [email protected] Website: www.ciqtekglobal.com Address: No. 1969, Kongquetai Road, High-tech Zone, Hefei City, Anhui Province,China