Overview

The document details specifications, features, functions, and standards compliance of contact profilometers SJ5 and SJ5730 series, designed for precise surface roughness and contour measurements in various industrial applications such as bearing raceways, molds, car parts, gear teeth, and engine blades.

1. Application and Features

• Simultaneous evaluation of contour and roughness parameters from a single scan.
• High precision, stability, and repeatability in measurements.
• Advanced intelligent management and software analysis systems.
• Intelligent protection during scanning to prevent damage.
• Flexible manual control and plug-in probes for easy replacement.
• Wide measuring range at nano-scale roughness levels.
• Extremely low measuring force to avoid surface scratching.

2. Measurement Functions and Parameters

• Parameter Classification: Roughness, contour, and shape error measurements.
• Filters: 2RC, Gaussian, and zero phase filtering available.
• Cut-off Wavelengths: Selectable from 0.008 mm to 8 mm for contour; 0.25 µm to 25 µm for roughness.
• Roughness Evaluation: Parameters include Ra, Rp, Rv, Rz, Rt, Rmax, Rq, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, motif and core parameters, among others.
• Contour Evaluation: Original profile (P), surface roughness profile (R), waviness (W).
• Special Tools: Ball screw measurement with corrected helix angle, thread measurement, stage height, groove depth/width, area, convexity, and aspheric surface shape error measurement.
• Custom Measurement: Ability to customize measurement processes to avoid unnecessary areas and perform discontinuous measurements, especially useful for surfaces with central holes.

3. Standards Compliance

The instruments comply with multiple international and national standards, including:

• DIN EN ISO 4287:2010
• ASME B46.1-2002
• JIS B 0601:2013 and earlier versions
• GB/T 3505-2009
• ISO 4287:1997
• ISO 13565-2:1996
• ISO 1302:2002
• JJF 1099-2018
• ISO 4288-1996
• GBT 1031-2009

4. Technical Specifications

SJ5730-100 Model

• Measuring Range: 0–100 mm (X), 0–300 mm (Z)
• Resolution: 0.001 µm
• Accuracy: ≤ ±(0.5 + 0.03 H) µm (H in mm)
• Pt (Peak-to-Valley) Accuracy: ≤ 0.2 µm
• Angle Accuracy: ≤ ±1'
• Scanning Speed: 0–20 mm/s
• Measuring Force: Adjustable between 0.5 mN to 3 mN
• Ra Measurement Range: 0.012 µm to 12.5 µm with accuracy varying by roughness level
• Repeatability: 1δ ≤ 1 nm
• Filters: Gaussian, 2RC, zero phase
• Sampling Lengths: Selectable from 0.008 mm to 25 mm
• Size (L×W×H): 600×350×890 mm
• Weight: 110 kg
• X-axis Straightness: ±6 µm (optional ±12 µm)

SJ5730-200 Model

• Measuring Range: 0–200 mm (X), 0–500 mm (Z)
• Resolution: 0.001 µm
• Accuracy: ≤ ±(0.5 + 0.03 H) µm (H in mm)
• Pt Accuracy: ≤ 0.2 µm
• Angle Accuracy: ≤ ±1'
• Scanning Speed: 0–20 mm/s
• Measuring Force: Adjustable between 0.5 mN to 3 mN
• Ra Measurement Range: 0.012 µm to 12.5 µm with accuracy varying by roughness level
• Repeatability: 1δ ≤ 1 nm
• Filters: Gaussian, 2RC, zero phase
• Sampling Lengths: Selectable from 0.008 mm to 25 mm
• Size (L×W×H): 800×500×1080 mm
• Weight: 180 kg
• X-axis Straightness: ±6 µm (optional ±12 µm)

5. Measurement Parameters and Tools

The instruments support a wide range of parameters including micro profile parameters (Pt, Pa, Fig), inclination parameters (Smx, Smn), horizontal axis angle (Tilt), distance parameters (Xp, Xv, Xt), RMS roughness, slope parameters, vertex radius error, waviness parameters (Wa, Wq, Wt, etc.), roughness parameters (Rp, Rv, Rz, Rc, Rt, Ra, Rq, Rsk, Rku, etc.), key roughness parameters (Rk, Rpk, Rvk, etc.), and motif parameters.

6. Accuracy and Repeatability

• Accuracy is validated against standard gauge blocks, standard balls (diameter < 25 mm), 50 mm standard balls with arcs exceeding 90°, polygonal prisms, optical flats, and standard roughness blocks.
• Repeatability is confirmed using 0.1–0.2 µm square wave roughness blocks and standard step height blocks.
• Measurement residuals and repeatability are maintained at nanometer levels, ensuring high precision.

Summary

The SJ5 and SJ5730 profilometers are advanced contact measurement instruments offering simultaneous contour and roughness evaluation with high precision and flexibility. They comply with international standards and provide extensive measurement parameters and customizable functions suitable for complex industrial surfaces. Their technical specifications support nano-scale resolution and accuracy, making them suitable for critical quality control in manufacturing processes.