CHOTEST Scanning Electron Microscope(SEM) CMA3000A

Product catalog summary

Overview
The CEM3000A is a desktop scanning electron microscope (SEM) designed for micro-scale morphology observation and analysis. It is compact, easy to use, and offers high-resolution imaging capabilities. The device is suitable for various applications, including the photovoltaic industry, nanomaterials, and biomedical fields.

Key Features

Compact Design: The desktop size allows for easy placement and relocation, making it versatile for multiple locations.
High Resolution: Capable of observing extremely small features with high contrast and large depth of field.
Fast Pumping and Venting: The unique vacuum system design reduces waiting times significantly.
Automatic Adjustments: Features automatic beam alignment, autofocus, and auto stigmation for rapid imaging and one-click image acquisition.
Large Sample Chamber: Comparable to floor-standing SEMs, accommodating larger samples.
Vibration and Magnetic Interference Resistance: Enhanced by patented composite vibration damping technology.
Low Vacuum Mode: Optional feature for observing different sample types.
Multiple Probes and Analysis Capabilities: Equipped with EDS line scan function and various imaging parameters.

Technical Specifications

Electron Gun: Tungsten Filament
Resolution: Better than 4nm (SE), better than 8nm (BSE) at 20kV
Accelerating Voltage: 1 ~ 20kV
Magnification: 40 ~ 300,000×
Detectors: Secondary Electron (SE), Backscattered Electron (BSE), Energy Dispersive Spectrometer (EDS)
Vacuum Levels: High Vacuum: Better than 9×10-3Pa; Low Vacuum: 5 ~ 100 Pa (Optional)
Pumping Time: High Vacuum Mode: < 180s; Low Vacuum Mode: < 120s
Sample Changeover Time: Vacuum discharge < 30s; Vacuum re-pumping < 100s
Motorized Axes: X, Y, T; Manual Axes: R, Z
Travel Range: X: 50mm, Y: 50mm, T: -22.5°~ +22.5°, R: 0°~360°, Z: 45mm
Operating System: Windows 10/11 (64bit)
Image Size: 640×480 to 10240×7680
Weight and Size: 120kg, 400x670x730mm
Operating Environment: Temperature: 15°C~30°C, Humidity: <65%

Additional Information
Issued by Chotest Technology Inc., the document emphasizes the company's commitment to precision measurement solutions. For more details, users are encouraged to visit the company's website.

Catalog excerpts

CHOTEST Scanning Electron Microscope(SEM) CMA3000A-1

Micro-Scale Morphology Observation and Analysis

Open the catalog to page 1

CHOTEST Scanning Electron Microscope(SEM) CMA3000A-2

Desktop, compact size CEM3000 series desktop SEM is not constrained by site size, oﬀering max spatial applicability. Users can place it conveniently on their desk and easily relocate it, enabling one machine to serve multiple locations. High Resolution High resolution enables observation and analysis of extremely small features High Resolution Fast Pumping&Venting Large Depth of Field High Contrast Featuring a unique vacuum system design, this series signiﬁcantly reduces the waiting time during gas pumping and venting. Automatic Beam Alignment / Auto Focus / Auto Stigmation. Using automatic adjustment...

Open the catalog to page 2

CHOTEST Scanning Electron Microscope(SEM) CMA3000A-3

■ Multiple Imaging ParametersOffers various imaging parameters for user selection, meeting the adjustment needs of professional users. ■ High Vibration & Magnetic Interference Resistance Utilizes our composite vibration damping method(patented technology) to elevate the vibration resistance of SEM to a new level. ■ Large Sample Chamber CEM3000A has a large chamber comparable to a floor-standing SEM, while ensuring smaller external dimensions. Equipped with multiple probes, enabling various analysis methods. Element Overlay Distribution Map EDS line scan function(IMC layer analysis)

Open the catalog to page 3

CHOTEST Scanning Electron Microscope(SEM) CMA3000A-4

Convenient Operation Setup SEM CEM3000 series software interface is concise with clear functional guidance, and the convenient joystick allows users to perform routine operations CEM3000 Series Software Interface Application Examples Standard Sample (Solder Ball Particles) Photovoltaic Industry (Solar Panel) Nanomaterials (60nm diameter Ag wire) Biomedical (Microﬂuidic Chip) High-Entropy Alloy Powder BOSCH Rocess Dry Etching Texture

Open the catalog to page 4

CHOTEST Scanning Electron Microscope(SEM) CMA3000A-6

From nanometer to hectometer we provide professional precision measurement solutions Chotest Technology Inc. Office Add: 2/F, Building B1, Zhiyuan, Xueyuan Road, Xili, Nanshan, Shenzhen, China Factory Add: 1/F, Building No.7, HKC Industry Park, Shiyan, Baoan, Shenzhen, China Tel: 0755-83318988-227 Fax: 0755-83312849 E-mail: [email protected] Please visit our website for more information WWW.CHOTEST.COM NOTE:CHOTEST HAS MADE CONSIDERABLE EFFORTS TO ENSURE THE CONTENT OF THIS DOCUMENT IS CORRECT AT THE DATE OF PUBLICATION BUT MAKES NO WARRANTIES OR REPRESENTATIONS REGARDING THE CONTENT. lssued:December,...

Open the catalog to page 6