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CMS-3 ? Capacitive Measurement System for hole diameter measurement

CMS-3 ? Capacitive Measurement System for hole diameter measurement
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CMS-3 ? Capacitive Measurement System for hole diameter measurement - 1

• Operators can map straight, tapered, or countersink fastener holes in seconds. • Immediately see PASS/FAIL indication of hole quality. • Interface with industry standard data collectors to comply with customers quality requirements. (e.g. SPC trend analysis, six sigma, gauge R&R analysis, etc..) • Maximum hole profile non-linearity: 100 micron range +/-0.0003” (+/- 6 microns ) 200 micron range +/-0.0006” (+/-12 microns ) US H EA DQ UA RT ERS Capacitec, Inc. 87 Fitchburg Road P.O. Box 819 Ayer, Massachusetts 01432 USA 978-772-6033 FAX: 772-6036 sales@capacitec.com EURO P EA N H EA DQ UA RT ERS Capacitec Europe 16, rue Séjourné 94044 CRETEIL cedex FRANCE 331 43 39 48 68 FAX 49 80 07 49 eurosales@capacitec.com CMS-3 ™ Capacitive Measurement System for hole diameter measurement INST A NT LY A ND A C C URA T ELY MEA SURE FA ST ENER H O LES WIT H MINIMUM O P ERA T O R INFLUENC E A irframe and other demanding structures require thousands of fastener hole inspections to insure compliance to exacting design specifications. The C apacitiv e M easurement S y stem (C M S 3) and C apacitiv e Hole P robe ( C HP ) combine to form a sy stem that reduces test time, increases accuracy and reduces operator influence. The sy stem can inspect 24 inside diameter locations of a fastener hole, in one insertion, in less than 3 seconds. REA DY FO R SP C In addition to P A S S /F A IL indication, the C M S -3 interfaces w ith industry standard data collectors for in-process trend analy sis.

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CMS-3 ? Capacitive Measurement System for hole diameter measurement - 2

CMS-3 ™ Capacitive Measurement System for hole diameter measurement Features and Functions: • High-Speed, high-precision measurement of straight, tapered or countersink fastener holes • Immediate Pass/Fail display of hole quality • Interfaces with industry standard data collectors for SPC trend analysis • Dramatically increases measurement throughput while minimizing operator induced errors • Rigid probe design provides a unique center-line data reference. • The probes include a total of 48 non-contact sensors ( 6 levels of 8 sensors ) • Multi-sensor probe design for rapid, single-insertion...

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