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CMS-3 ? Capacitive Measurement System for hole diameter measurement

CMS-3 ? Capacitive Measurement System for hole diameter measurement

CMS-3 ? Capacitive Measurement System for hole diameter measurement

Product catalog summary
Overview: The CMS-3 Capacitive Measurement System is designed for high-speed, accurate measurement of fastener holes in airframes and other demanding structures. It combines the Capacitive Measurement System (CMS-3) and Capacitive Hole Probe (CHP) to reduce test time and operator influence while increasing accuracy.
Key Features:
  • Measures straight, tapered, or countersink fastener holes in seconds.
  • Provides immediate PASS/FAIL indication of hole quality.
  • Interfaces with industry-standard data collectors for SPC trend analysis, six sigma, and gauge R&R analysis.
  • Reduces operator-induced errors and increases measurement throughput.
  • Rigid probe design offers a unique center-line data reference.
  • Multi-sensor probe design allows rapid, single-insertion comprehensive hole measurement and profiling.
Specifications:
  • CMS-3: Weighs under 1 pound (0.5Kg), powered by three AA 1.5V batteries, operates at 50-105°F (10-40°C), and outputs data via standard RS232. Typical accuracy is +/-0.0003” (6 microns) for 100 micron range and +/-0.0006” (12 microns) for 200 micron range.
  • CHP Probes: Standard diameters range from 0.1563” to 1.500” (3.97 to 38.1 mm) to match fractional bolt sizes, suitable for straight or tapered holes with or without countersinks. Typical range is 0.004” (100 microns) with an extended range to 200 microns.
  • CMS Wireless option available for remote or automated testing.
Contact Information:
  • US Headquarters: Capacitec, Inc., 87 Fitchburg Road, P.O. Box 819, Ayer, Massachusetts 01432, USA. Phone: 978-772-6033, Fax: 772-6036, Email: [email protected]
  • European Headquarters: Capacitec Europe, 16, rue Séjourné, 94044 CRETEIL cedex, FRANCE. Phone: 331 43 39 48 68, Fax: 49 80 07 49, Email: [email protected]
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Catalog excerpts

CMS-3 ? Capacitive Measurement System for hole diameter measurement-1

• Operators can map straight, tapered, or countersink fastener holes in seconds. • Immediately see PASS/FAIL indication of hole quality. • Interface with industry standard data collectors to comply with customers quality requirements. (e.g. SPC trend analysis, six sigma, gauge R&R analysis, etc..) • Maximum hole profile non-linearity: 100 micron range +/-0.0003” (+/- 6 microns ) 200 micron range +/-0.0006” (+/-12 microns ) US H EA DQ UA RT ERS Capacitec, Inc. 87 Fitchburg Road P.O. Box 819 Ayer, Massachusetts 01432 USA 978-772-6033 FAX: 772-6036 [email protected] EURO P EA N H EA DQ UA RT ERS Capacitec Europe 16, rue Séjourné 94044 CRETEIL cedex FRANCE 331 43 39 48 68 FAX 49 80 07 49 [email protected] CMS-3 ™ Capacitive Measurement System for hole diameter measurement INST A NT LY A ND A C C URA T ELY MEA SURE FA ST ENER H O LES WIT H MINIMUM O P ERA T O R INFLUENC E A irframe and other demanding structures require thousands of fastener hole inspections to insure compliance to exacting design specifications. The C apacitiv e M easurement S y stem (C M S 3) and C apacitiv e Hole P robe ( C HP ) combine to form a sy stem that reduces test time, increases accuracy and reduces operator influence. The sy stem can inspect 24 inside diameter locations of a fastener hole, in one insertion, in less than 3 seconds. REA DY FO R SP C In addition to P A S S /F A IL indication, the C M S -3 interfaces w ith industry standard data collectors for in-process trend analy sis.

 Open the catalog to page 1
CMS-3 ? Capacitive Measurement System for hole diameter measurement-2

CMS-3 ™ Capacitive Measurement System for hole diameter measurement Features and Functions: • High-Speed, high-precision measurement of straight, tapered or countersink fastener holes • Immediate Pass/Fail display of hole quality • Interfaces with industry standard data collectors for SPC trend analysis • Dramatically increases measurement throughput while minimizing operator induced errors • Rigid probe design provides a unique center-line data reference. • The probes include a total of 48 non-contact sensors ( 6 levels of 8 sensors ) • Multi-sensor probe design for rapid, single-insertion comprehensive...

 Open the catalog to page 2

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