FT-NIR PROCESS SPECTROMETER MATRIX-F II Keeping an eye on your process Innovation with Integrity

Check important process parameters immediately for reaction monitoring and control Optical spectroscopy is today a highly important technology for online process monitoring and optimization. Fiber-coupled probes allow a direct look into the process without time delay. The MATRIX-F II FT-NIR spectrometer allows direct measurements in process reactors and pipelines, leading to a better understanding and control of the process. Its innovative technology provides consistent high quality results, less downtime and direct method transfer. All Bruker process spectrometers are characterized by robustness,...

MATRIX-F II Series One Spectrometer - Multiple Options The MATRIX-F II is the only FT-NIR spectrometer which can measure material in contact as well as contactless with just one instrument. Different measurement accessories are available: Fiber Optic Probes: Classic diffuse reflectance, transflectance or transmission immersion probes with various path lengths can be adapted as well as process flow cells or pilot plant assemblies. Various probe materials are available, like stainless steel or Hastelloy. Moreover, the probe can be customized to different lengths and flange geometries. MATRIX-F...

Accessories Immersion Probes Immersion probes are most widely used for FT-NIR measurements in process control. Bruker will assist to select the appropriate probe with the best materials matching the process conditions. In many cases the plant or reactor will already be equipped standard connection ports for immersion probes. Transmission probes with optional flange adaption for measuring transparent liquids (photo: Hellma Analytics) Immersion probes can be divided into three groups based on the measuring principle: Transmission probes for clear liquids Reflection probes for solid materials Transflection...

Sensor Heads for non-contact Analysis Sensor head is placed on the laboratory mount for offline measurements The NIR sensor head was designed by Bruker for contactless measurements of moving solid materials in diffuse reflection mode. Compared to conventional reflection probes the Sensor Head offers some unique advantages: Two NIR light sources illuminate a sampling spot of approx. 10 mm in diameter - over 10 times more than a conventional diffuse reflection probe. Connecting the sensor head to a viewing window of a reactor For enhanced process safety, the sensor head can be operated in single...

Process Analyzer Cabinets Dust and Water Protection The MATRIX-F II and its peripherals like the industrial PC are designed to fit easily into standard 19” rack, making it ideal for the use in process analyzer cabinets. The additional protection option covers all electrical connections of the MATRIX-F II and reaches and ingress protection level of IP65 that allows an installation in really dirty and dusty environments. These cabinets are recommended for the following situations: Occurrence of temperature fluctuations Access to the spectrometer needs to be restricted Environment with high humidity...

The MATRIX-F II is certified to guide light into hazardous areas which require following equipment specs (ATEX resp. and [IECEx]): Alternatively, the MATRIX-F II can be installed inside a pressurized and temperature stabilized Ex-cabinet (part no. S164EX). The Ex-cabinet is certified for use in Zone 1 up to gas group IIC with temperature class T4. The MATRIX-F ex-proof is certified for the installation in Ex-areas which require following etgjpment specs (ATEX resp. and IECEx): In combination with a MATRIX-F II (which is installed in ordinary locations), the sensor head is also available as an...

CMET Process Software The CMET Process Software is the link between Bruker's outstanding FT-NIR process analyzer and the customers Distributed Control System (DCS). Commands given by the DCS are transferred to CMET which in return starts a specific measurement and transmits the data back to the DCS for visualization and archiving. The increasing demand of automation requires not only a state-of-the-art hardware but also an equivalent software. CMET consists of a configuration interface and a runtime environment, which can also be installed on separate PC's. ■ Easy-to-use Modular Concept ■ Standalone...

To monitor the most recent data, CMET Runtime is equipped with a web based (including network access) trend chart. Monitor the current measurement results using self-updating trend charts for each product. Brows your database stored result history. CMET supports various communication protocols, the following are offered by Bruker: - Client and Server functionality - ADAM Units - Analog Cards (PCI slot required) - Ethernet TCP/IP (e.g. Modbus TCP, Allen-Bradley, Siements Industrial Ethernet) (On-Board Solution, MATRIX-F II only) - Modbus (Connection: RS485, RS232, Ethernet TCP/IP) Realtime FH...

Applications: Chemical, Polymer & Pharma Process analytical technology (PAT) aims at controlling the manufacturing process to ensure a reliable quality of the final product. The need for shifting the quality control from the end product to the production has been recognized by the chemical, petrochemical and pharmaceutical industry alike. This is achieved by real-time analysis of raw materials, intermediates and final products by FT-NIR spectroscopy. Example: Chemical Industry FT-NIR technology is widely used in a variety of chemical industries. The high information content in NIR spectra, measured...

Fluid-bed reactor with process probe measuring in reflection mode or motor octane number (RON and MON) and density as well as the analysis of PIONA. Moreover, FT-NIR is widely used for monitoring gasoline and diesel blending processes. Example: Pharmaceutical Tablet Production The production of tablets in the pharmaceutical industry involves mixing, granulation, drying, compression and coating. These different processing steps can be monitored online with a MATRIX-F II in combination with a diffuse reflectance probe or a sensor head to ensure the product safety and minimize the risk of faulty...