Group: Bruker
Catalog excerpts
Contour CMM Dimensional Analysis System Surface and Dimensional Analysis, Complete Data, One Instrument Bruker’s Contour CMM™ system is the world’s first non-contact metrology system to perform simultaneous nanoscale height, surface texture, waviness and form measurements, as well as 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument. Leveraging decades of world-leading optical metrology innovation, the system performs rapid, non-contact precision measurements to meet the industry’s most stringent standards. Its Vision Dimensions™ software offers proprietary features specifically designed for small-part characterization, including automation for part programs, hundreds of preset analyses, and customized inspection reports. Contour CMM enables more stringent metrology for R&D and manufacturing of the small structures in precision-machined components across a wide range of industries, from medical and optics to automotive and aerospace. Innovation with Integrity Unmatched Metrology Value in a Single System A single, thermally regulated system delivers measurement of surface roughness, geometric dimensions, and tolerancing analysis Proprietary optical probe enables high-density 3D nanoscale surface measurements VisionDMIS module allows automated part defect analysis and deviation from CAD reporting Measurement with certified fixtures ensures performance compliance with ISO 10360-3/-8 and ISO 25178-2 standards
Open the catalog to page 1Contour CMM utilizes the high-density, nanoscale-resolution of white light interferometry (WLI) based on Bruker’s industry-leading Wyko® optical profiling technology. However, now with its combination of techniques, the measurement capabilities of Contour CMM transcend the boundaries of surface and coordinate characterization, enabling a metrology continuum from surface roughness and texture through waviness into true 3D coordinate measurements. The system provides extremely high vertical (2-nanometer) and lateral (0.9-micron) resolution and, when combined with high accuracy stages, enables...
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