Contour CMM Dimensional Analysis System
2Pages

{{requestButtons}}

Catalog excerpts

Contour CMM Dimensional Analysis System - 1

Contour CMM Dimensional Analysis System Surface and Dimensional Analysis, Complete Data, One Instrument Bruker’s Contour CMM™ system is the world’s first non-contact metrology system to perform simultaneous nanoscale height, surface texture, waviness and form measurements, as well as 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument. Leveraging decades of world-leading optical metrology innovation, the system performs rapid, non-contact precision measurements to meet the industry’s most stringent standards. Its Vision Dimensions™ software offers proprietary features specifically designed for small-part characterization, including automation for part programs, hundreds of preset analyses, and customized inspection reports. Contour CMM enables more stringent metrology for R&D and manufacturing of the small structures in precision-machined components across a wide range of industries, from medical and optics to automotive and aerospace. Innovation with Integrity Unmatched Metrology Value in a Single System A single, thermally regulated system delivers measurement of surface roughness, geometric dimensions, and tolerancing analysis Proprietary optical probe enables high-density 3D nanoscale surface measurements VisionDMIS module allows automated part defect analysis and deviation from CAD reporting Measurement with certified fixtures ensures performance compliance with ISO 10360-3/-8 and ISO 25178-2 standards

Open the catalog to page 1
Contour CMM Dimensional Analysis System - 2

Contour CMM utilizes the high-density, nanoscale-resolution of white light interferometry (WLI) based on Bruker’s industry-leading Wyko® optical profiling technology. However, now with its combination of techniques, the measurement capabilities of Contour CMM transcend the boundaries of surface and coordinate characterization, enabling a metrology continuum from surface roughness and texture through waviness into true 3D coordinate measurements. The system provides extremely high vertical (2-nanometer) and lateral (0.9-micron) resolution and, when combined with high accuracy stages, enables...

Open the catalog to page 2

All Bruker Nano Surfaces catalogs and technical brochures

  1. XSense

    2 Pages

  2. AFM-Raman

    8 Pages

  3. LCMS-116

    6 Pages

  4. solarix XR

    12 Pages

  5. LCMS-113

    6 Pages

  6. LCMS-115

    8 Pages

  7. PN-30

    4 Pages

  8. LCMS-118

    6 Pages

  9. PN-31

    4 Pages

  10. FUSION-SV

    2 Pages

  11. PN-36

    4 Pages

  12. IFS

    8 Pages

  13. PN-41

    6 Pages

  14. amaZon speed

    10 Pages

  15. CP-4

    2 Pages