NANOSTAR Small Angle X-ray Scattering Solutions Innovation with Integrity

METALJET X-ray Source TURBO X-RAY SOURCE Microfocus X-ray Source SCATEX pinholes Pinhole Collimator

NANOSTAR – Enter the Universe of Nanostructure Analysis DIFFRAC.NANOFIT Today, the most significant advances in the field of metal, metal-organic, and organic material development are gained almost exclusively by defining their properties through the implementation of nanostructures and nanostructured surfaces. Small Angle X-ray Scattering (SAXS) has proven to be a very reliable, nondestructive method for the analysis of nanostructures. As a matter of fact, SAXS has become a key characterization technique for laboratories and R & D departments concerned with morphological determination of nanostructures....

NANOSTAR – Find Everything in Anything with SAXS Dimensions measured by Wide Angle X-ray Scattering Dimensions measured by Small Angle X-ray Scattering SAXS pattern from a polymer sample Get information on Size and size distribution Shape Orientation Particle distances Inner surface WAXS pattern from a wood sample Small Angle X-ray Scattering is a phenomenon caused by particles embedded in a matrix of different electron density. If the particle size ranges from 1 nm to 100 nm, the scattering angle lies within the range of 0° to 5°, depending on the X-ray wavelength used. The smaller the particles...

NANOSTAR – Find Everything in Anything with GISAXS qz 2qGISAXS GISAXS pattern of an unaltered multilayer mirror GISAXS pattern of a nanostructured surface To probe the surface and subsurface structural details, samples are measured in grazing incidence geometry. The incident angles are close to the so-called critical angle of total reflection and typically lie between 0.1 and 0.7 degrees. By changing the incident angle, different regions of interest on or just below the surface are probed. In a Grazing Incidence Small Angle X-ray Scattering (GISAXS) experiment, the diffusely scattered intensity...

NANOSTAR – Fast Sample Mapping The NANOSTAR's automatic XY sample stage permits taking 2-D Nanographs. By point-and-click operation, the spot-of-interest on the sample is selected. Instead of blindly illuminating the sample with radiation, this unique feature of the NANOSTAR can save an enormous amount of effort and time. X-ray Nanography is a powerful tool for displaying and investigating the microscopic structure of specimens on the micrometer scale. In this way, Nanography unifies the nanoworld with the microworld. The power of this technique is demonstrated by the example on the left. It...

A Nanography investigation requires a specimen to be mounted on a motor-driven XY stage integrated into the sample chamber of the NANOSTAR. This allows the sample to be scanned through the X-ray beam automatically. Nanography shows inhomogeneities such as different chemical compositions or varying density. Nanography permits fast and selective detection of relevant measuring points with inhomogeneous samples and allows even small samples to be positioned precisely. Each individual point of the complete Nanography image itself represents the integral SAXS/WAXS intensity collected by the 2-D detector....

METALJET X-ray Source Unique microfocus X-ray source based on metal-jet technology featuring an unmatched source brightness Sample Chamber Thanks to the generous size of the sample chamber, the NANOSTAR provides enough space to install additional components for individualized handling of samples. A computer-controlled holder for reference samples is built into this chamber. To operate the system in simultaneous SAXS/WAXS mode, an Image Plate can be placed into the chamber just in front of the rear panel. TURBO X-RAY SOURCE (TXS) This high-performance rotating anode X-ray source supplies an extremely...

NANOSTAR – Best Components for Best Results Sample Stage One of the NANOSTAR’s special features is its unique convenience in mounting samples and the possibility of inserting several samples simultaneously, e.g. for testing series. Moreover, samples can be analyzed at different ambient conditions or in GISAXS geometry. VÅNTEC-2000 Detector A maintenance-free detector with maximum performance in angular resolution, low background and dynamic range. Primary Beam Stop The highly absorbent beam stop is mounted with two X-ray transparent wires. The size of the beam stop is optimized for the selected...

NANOSTAR – Leadership in Technical Innovation METALJET X-ray Source Turbo pump Shutter electronics MONTEL optics Unmatched X-ray source brilliance Smallest spot size available Fully integrated in the NANOSTAR platform Focusing coil The NANOSTAR has always set the benchmark for technological innovations, and continues to do so. Thanks to its open platform design, the latest technologies can be integrated to open doors towards new applications. Recently, a breakthrough in X-ray source technology was realized with the introduction of liquid metal jet sources. This new type of X-ray source outperforms...

NANOSTAR – Best X-Ray Beam Quality SCATEX Pinhole Collimation Parasitic scattering Traditional pinholes SCATEX pinholes In the traditional 3-pinhole setup the third pinhole is used to block most of the parasitic scatter coming from the first two pinholes. The parasitic scatter is one reason, besides the beam divergence, why the beam stop in front of the detector needs to be larger than just the direct beam. This limits the resolution that can be achieved. No parasitic pinhole scattering No antiscatter pinhole needed Increased X-ray flux for similar resolution In contrast to conventional pinholes,...

NANOSTAR – Modular Design for Top-of-class Results Modular setup for greatest flexibility X-ray sources: IµS, TXS and METALJET MONTEL optics with exchangeable pinhole collimation system for high flux/high resolution Large sample chamber accommodating a variety of sample holder Variable sample-to-detector distance covering a wide q-range The NANOSTAR with its incomparable modularity is the ideal tool for characterization of nanostructures ranging from 1 nm to about 125 nm and nanostructured surfaces. The mirror-conditioned pinhole collimation system provides a highly intense, parallel X-ray beam...