D4 ENDEAVOR - Diffraction Solutions
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Diffraction Solutions novation with Integrity

The range of X-ray diffraction tasks is as broad as the variety of your samples. The combined solution for all these tasks is our D4 ENDEAVOR. The D4 ENDEAVOR is designed for specific tasks but is still highly flexible. D4 ENDEAVOR masters all tasks for qualitative or quantitative phase analysis, peak profile analysis or residual stress determination or structure solution. The D4 ENDEAVOR’s high-precision 2-circle goniometer and modern X-ray optics and detectors guarantee excellent analytical results – with unrivaled speed and the capability to handle a wide variety of samples. Our...

D4 ENDEAVOR – your perfect partner Width: 84 cm (33.1")

Everything under control, no matter where or when – D4 ENDEAVOR via networks The technology and the software of our D4 ENDEAVOR allow fully automatic measurements, analyses and sample changing – in short, the entire analysis process is automatic. Data exchange between the equipment and the operator software uses the TCP/IP-based client / server principle. This means that you can start and monitor measurements from any computer in the network for use in your daily work. You can prepare your analysis reports directly in your office while other measurements are still running, even if your...

Unlimited freedom for your samples – sample handling with the D4 ENDEAVOR No two samples are the same. This is why we came up with a clever idea for the D4 ENDEAVOR – its revolutionary sample handling concept. This gives you the greatest possible flexibility for sample preparation and selection. Whether examining pressed powders, thin films, smallest sample amounts, liquids, or even small workpieces – they can all be inserted and analyzed at the same time in the up to 120 positions of our D4 ENDEAVOR magazine. The usual analytical limitations associated with the use of a sample changer are...

Minimum preparation effort, as a wide range of different sample sizes can be handled simultaneously Extremely rapid sample transfer to measuring position to minimize processing time 66, 72, or 120 positions in the sample magazine can be loaded and unloaded at any time Randomized fine powder is filled in sample rings. You can choose the ring size to suit the amount of material available. Powder samples Powder, liquid, or solid samples – a wide variety of sample holders in Oriented powder Powder samples of materials that tend to form a preferred orientation can be prepared in sample rings...

Maximum flexibility – sample handling with the D4 ENDEAVOR Suitably shaped samples If you have solid samples or samples that you can prepare compactly in the right dimensions, just insert them directly and get started. Environment-sensitive samples Rings are available for such samples. The rings can even be filled with liquids. The measuring surface is sealed by a thin foil. Irregularly shaped samples Workpieces can be examined non-destructively by placing them into suitable holder rings. Small sample amounts Rings providing a background-free silicon crystal permitting analysis of even the...

The entire analytical world qualitative I quantitative I crystallite

On the trail of macroscopic properties – residual stress analysis The macroscopic properties of many high-tech materials depend deliberately upon the direction chosen. X-ray diffraction is the definitive and most well established and non-destructive technique for the determination of the complete residual characteristics in materials and workpieces. To determine the residual stress in a workpiece, the angular shift of a reflection must be reliably measured at the largest possible diffraction angle and as a function of the angle between the incident X-ray beam and the sample surface. For an...

Crystal structures – D4 ENDEAVOR with TOPAS Crystal structure determination and refinement using powder diffraction are vital analytical methods in mineralogy and organic and inorganic chemistry. Our D4 ENDEAVOR partners TOPAS software for a highly efficient solution. Mineralogical samples or chemical and pharmaceutical samples frequently provide very complex diffractograms or only weak scattering signals. This makes it important to combine the optimum X-ray optical components and detectors to suit the analytical requirements. Your solution? Our D4 ENDEAVOR. The D4 ENDEAVOR offers the...

Analysis down to the finest detail – microstrain and crystallite size Thanks to the quality of the data measured with the D4 ENDEAVOR, a more detailed analysis of the individual reflection profiles reveals further important information such as crystallite size and microstrain. Pioneering, convenient and informative for this task – TOPAS. To determine the mean crystallite size within a sample with maximum accuracy, you perform a profile fitting to a measured reflection with TOPAS, the software considers all the effects of the instrument parameters on the profile shape. The result of this...

Quantitative phase analysis no trace gets lost File View Option; Window Help Weight Percent offer maximum flexibility for exact quantitative phase analysis, where the absolute reflection intensities of the phases examined must be determined. This is exactly the right job for either DQUANT orTOPAS. DQUANT is achieved by the clever measurement data analysis You can easily define the optimum measuring and analysis strategy for your analytical task. Depending on necessary to determine the scattered ntensity of a phase from background- subtracted, completely measured reflection profiles. If the...

Qualitative phase analysis – it’s so easy with the plus D4 ENDEAVOR and DIFFRAC The most important requirement for reliable qualitative phase analysis is the measurement of accurate powder diffractograms and a powerful data evaluation software: our D4 ENDEAVOR and DIFFRACplus. And this is how you do a phase analysis with plus DIFFRAC – well known simple and userfriendly: The first step is to define the measuring job and the corresponding sample positions in the magazine – DIFFRACplus takes care of the measurements automatically. You can define and measure priority samples at any time. In...