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IF-Profiler

Product catalog summary

Overview: The IIF-Profiler is a handheld 3D roughness measurement system designed for high-resolution surface finish measurements. It is capable of measuring both flat and curved components using a single system, adhering to ISO 4287 for profile-based and ISO 25178 for areal-based measurements. The device is lightweight, ergonomic, and ensures traceable and repeatable measurements within a minimum time of three seconds.

General Specifications: The system features a positioning volume of 25 mm and can accommodate specimens with a radius of up to 100 mm. The device is equipped with a 3D measurement sensor and a robust framework that balances ease of use with mechanical rigidity.

Objective Specific Features: The IIF-Profiler offers objective magnifications of 10x, 20x, and 50x, with numerical apertures of 0.3, 0.4, and 0.6 respectively. The working distances for these objectives are 17.5 mm, 16 mm, and 10.1 mm. The lateral measurement areas vary from 2 mm x 2 mm to 0.4 mm x 0.4 mm, with measurement point distances ranging from 1 μm to 0.2 μm. The calculated lateral optical limiting resolution is between 1.09 μm and 0.54 μm, while the finest lateral topographic resolution ranges from 2 μm to 0.64 μm. Measurement noise is specified at 40 nm, 20 nm, and 10 nm, with vertical resolutions of 100 nm, 50 nm, and 20 nm. The vertical measurement area spans 16 mm, 15 mm, and 9 mm, with accessibility angles of 31°, 29°, and 19°.

Resolution and Application Specifications: The minimum measurable roughness Ra is 0.3 μm, 0.24 μm, and 0.18 μm, while the minimum measurable roughness Sa is 0.15 μm, 0.12 μm, and 0.09 μm. The maximum measurable slope angle is 87°.

Additional Features: Objectives with longer working distances are available upon request, enhancing the versatility of the system for various applications.

Catalog excerpts

3D profiler to measure roughness and surface finish IIF-Profiler is a handheld 3D roughness measurement system for high resolution measurement of surface finish. Users measure roughness of flat and curved components with only one system. Measurements are performed both profile based (ISO 4287) and areal based (ISO 25178). The lightweight IF-Profiler consists of a 3D measurement sensor and a robust, at the same time handy framework. The ergonomic design combines ease of use and required mechanical rigidity. Traceable and repeatable measurements are achieved in a min. measurement time of three seconds. Bruker alicona I IF-Proﬁler

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GENERAL SPECIFICATIONS ositioning olume Specimen radius OBJECTIVE SPECIFIC FEATURES b ecti e magni cation Numerical aperture ateral measurement area x Measurement point distance Calculated lateral optical limiting resolution Working distance Vertical resolution Vertical measurement area inest lateral topograp ic resolution Measurement noise (*) Objectives with longer working distance available upon request RESOLUTION AND APPLICATION SPECIFICATIONS b ecti e magni cation Min. measurable roug ness Min. measurable roug ness Sa Max. measurable slope angle Specifications in blue mark Alicona specific...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.

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