Solar Cell Characterisation
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PVE300 Photovoltaic Device Spectral Response EQE (IPCE), IQE

The PVE300 is a turnkey solution for the determination of solar cell spectral response/ EQE (IPCE) and IQE. The ability to characterise both photovoltaic devices and materials renders the PVE300 a key component in research and production-line quality processes. Key features include: • Speed and Accuracy Using a monochromatic probe and NMI traceable calibrated reference diodes, the PVE300 allows the quick and accurate determination of solar cell characteristics. • Measurement of all Device Types Compatible with all types of photovoltaic devices and architectures: c:Si, mc:Si, a:Si,...

Measurement of spectral response/external quantum efficiency (IPCE) Measurement of total reflectance and transmittance Convert EQE to internal quantum efficiency

A dual Xenon/ quartz halogen source and TMc300, 300mm focal length monochromator ensures optimum illumination from the UV to the NIR. Operation in AC or DC mode. The DTR6 integrating sphere is mounted on an optical rail to the upper of the PVE300 chamber to allow the measurement of total reflectance and total transmittance Constant Current Power Supply A 610 constant current supply is required for each light source (xenon, quartz halogen and solar simulator). The excellent stability of the 610 ensures constant lamp output. Detection Electronics The 417 unit houses the detection electronics...

BenWin+ Control Software Fully automating the PVE300 over the USB interface, Benwin+ allows quick and easy system calibration and device measurements. Data may be analysed directly or exported to another platform as required. Relay Optic A reflective optic relays an image of the monochromator exit port onto the sample plane, providing a probe of any shape up to 6x6mm. Solar Simulator A variable intensity quartz halogen-based solar simulator with computer controlled shutter is mounted to the wall of the PVE300. Light is transported via six-branch fibre to ensure uniform illumination in...

The following options are required for the configuration of the PVE300. Single point measurement or device mapping • PVE300: Single point sample measurement • PVE300_XY: Includes motorised X-Y stage allowing the determination of device uniformity and IPCE . Spectral range • Monochromatic probe 300-1100nm, Si reference diode • Monochromatic probe 300-1800nm, Si and Ge reference diodes • Maximum range 250-3000nm: Please enquire Sample Mount • Temperature controlled vacuum mount: Measurement of front/ front and front/ rear contact devices with sample temperature control • PV_SS6:...

Optional Extras The PVE300 has been designed to be compatible with all types of photovoltaic device and architectures. The following extras are included to meet with specific device requirements. Multiple Light Bias Sources In the measurement of multi-junction devices, multiple solar simulators are required, one to bias the subcell under test at one sun, the other filtered simulator to ensure that the non–tested subcells are sufficiently illuminated that they do not current limit the tested subcell response. Voltage Biasing In the case of multiple junction cells and some thin film devices,...

Probe light source: Monochromator configuration: Bandwidth: 75W Xenon and 100W Quartz halogen Triple grating, symmetric, single Czerny -Turner, 300mm focal length Adjustable fixed slit, 1-10nm typical Software control: BenWin+ Windows application Wavelength Range: Wavelength accuracy: ± 0.4nm (600g/mm) Relay Optic: Mirror-based, 1.2x magnification Probe size: Up to 6x6mm Interface: USB Reference Diodes Diode & Range Traceability Voltage Bias (Keithley 2400) Voltage Range: -20 to 20V Silicon 300-1100nm; Germanium 800-1800nm PTB, Germany Temperature control: 4x70W Peltier-based...