PVE300 Photovoltaic Device Spectral Response
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PVE300 Photovoltaic Device Spectral Response EQE (IPCE), IQE

PVE300 The PVE300 is a turnkey solution for the determination of solar cell spectral response/ EQE (IPCE) and IQE. The ability to characterise both photovoltaic devices and materials renders the PVE300 a key component in research and production-line quality processes. Using a monochromatic probe and NMI traceable calibrated reference diodes, the PVE300 allows the quick and accurate determination of solar cell characteristics. Measurement of all Device Types Compatible with all types of photovoltaic devices and architectures: c:Si, mc:Si, a:Si, µ:Si, CdTe, CIGS, CIS, CZTS, Ge,...

Measurement of spectral response/external quantum efficiency (IPCE) Measurement of total reflectance and transmittance Convert EQE to internal quantum efficiency

PVE300 System Components Monochromatic Probe A dual Xenon/ quartz halogen source and TMc300, 300mm focal length monochromator ensures optimum illumination from the UV to the NIR. Operation in AC or DC mode. DTR6 Integrating Sphere The DTR6 integrating sphere is mounted on an optical rail to the upper of the PVE300 chamber to allow the measurement of total reflectance and total transmittance Constant Current Power Supply A 610 constant current supply is required for each light source (xenon, quartz halogen and solar simulator). The excellent stability of the 610 ensures constant lamp output....

ther a monochromatic probe ation at the plane of the mounted and electrically or is inserted to relay the sphere for the measurement of ctance. BenWin+ Control Software Fully automating the PVE300 over the USB interface, Benwin+ allows quick and easy system calibration and device measurements. Data may be analysed directly or exported to another platform as required. Relay Optic A reflective optic relays an image of the monochromator exit port onto the sample plane, providing a probe of any shape up to 6x6mm. Solar Simulator A variable intensity quartz halogen-based solar simulator with...

Configuration The following options are required for the configuration of the PVE300. Single point measurement or device mapping PVE300: Single point sample measurement PVE300_XY: Includes motorised X-Y stage allowing the determination of device uniformity and IPCE . Spectral range Monochromatic probe 300-1100nm, Si reference diode Monochromatic probe 300-1800nm, Si and Ge reference diodes Maximum range 250-3000nm: Please enquire Sample Mount Temperature controlled vacuum mount: Measurement of front/ front and front/ rear contact devices with sample temperature control PV_SS6: Measurement...

Optional Extras The PVE300 has been designed to be compatible with all types of photovoltaic device and architectures. The following extras are included to meet with specific device requirements. Multiple Light Bias Sources In the measurement of multi-junction devices, multiple solar simulators are required, one to bias the subcell under test at one sun, the other filtered simulator to ensure that the non–tested subcells are sufficiently illuminated that they do not current limit the tested subcell response. Voltage Biasing In the case of multiple junction cells and some thin film devices,...

Specifications Automation Monochromatic Probe Probe light source: 75W Xenon and 100W Quartz halogen Software control: BenWin+ Windows application Triple grating, symmetric, single Czerny -Turner, 300mm focal length configuration: Bandwidth: Adjustable fixed slit, 1-10nm typical Wavelength Range: Wavelength accuracy: Reference Diodes Silicon 300-1100nm; Diode & Range: Relay Optic: Probe size: Voltage Bias (Keithley 2400) Voltage Range: Current Limit: DTR6 Integrating Sphere Temperature-Controlled Vacuum Mount Temperature Feedback: Ba2SO4 Silicon/ Germanium/ SiliconInGaAs sandwich...