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N2 flow control for chemical nozzle

N2 flow control for chemical nozzle

N2 flow control for chemical nozzle

Product catalog summary
Introduction
This document addresses the challenges and solutions related to controlling the nitrogen flow rate for chemical spray nozzles in semiconductor wafer cleaning processes. The primary issues include difficulty in making fine adjustments to regulator settings and the impact of clogging on chemical flow rates, which affects cleaning quality.
Current Issues
The current system controls the nitrogen flow rate by adjusting regulator pressure. However, miniaturization requires precise adjustments for different products or processes, which is challenging with existing regulators.
Solutions
  • Solution 1: Implementation of a high-performance digital mass flow controller (model MQV_ _ _ _) that directly controls flow rate, ensuring stability and improved cleaning quality, unaffected by clogging.
  • Solution 2: Offers multiple methods to change flow rate settings from a host device, including external input switches, analog signals, and RS-485 communication.
  • Solution 3: Utilizes an ultra-fast micro-flow (μF) sensor combined with advanced actuator control technology for high-speed control and low differential pressure operation.
Technical Features
The μF sensor features a straight flow path with low pressure loss and an advanced rectification structure suitable for a wide range of applications. It includes digital circuitry for high-level actuator control and a proportioning solenoid valve with wide rangeability. The sensor's principle of measurement is based on temperature distribution changes around a heater, allowing for accurate mass flow rate calculations.
Conclusion
The proposed solutions aim to enhance the uniform application of cleaning chemicals in semiconductor processes by providing more precise and stable flow rate control, addressing the limitations of existing systems.
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Catalog excerpts

N2 flow control for chemical nozzle-1

Gas flow rate control N2 flow rate control for chemical spray nozzle More uniform application of wafer cleaning chemicals! Product name Process sensor Digital mass flow controller MQV_ _ _ _ Current Situation Process and equipment name Front-end process, single wafer cleaning equipment Current Issues The nitrogen f low rate for chemical spray noz zles is controlled by adjusting the regulator pressure. Due to miniaturization, the chemical flow rate must be minutely adjusted for each type of product or process. Problem 1 When the relationship of pressure and flow rate changes due to clogging, etc., the amount of chemical changes, affecting the quality of cleaning. Problem 2 For existing regulators, it is difficult to make fine changes in settings from a control device. Chemical solution Chemical solution Nozzle

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N2 flow control for chemical nozzle-2

High-performance digital mass flow controller (model MQV_ _ _ _ ) Various ways to change the settings from a host device Ultra-fast micro-flow (μF) sensor, combined with advanced actuator control technology Because the flow rate is directly controlled, it is not affected by clogging or other factors, affording greater stability and better cleaning quality. With the MQV_ _ _ _, you can change the flow rate settings using an external input switch, analog signal, or RS-485 communication. Achieves both high speed control of 300ms and low differential pressure operation. Other features: freely selectable...

 Open the catalog to page 2

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