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DX 833 - Shore M/AM benchtop hardness tester

DX 833 - Shore M/AM benchtop hardness tester

DX 833 - Shore M/AM benchtop hardness tester

Product catalog summary
Immediate Benefits: The DX 833 benchtop hardness tester offers electronic and automatic test cycles, eliminating human influence and ensuring greater accuracy. It maximizes measurement reproducibility with programmable probe descent speeds from 0.5 mm/s to 16 mm/s.
Field of Application: This tester is suitable for polymers, elastomers, rubbers, and gel-like materials of small to medium size and complex geometries, including plastics, rubber, medical items, paper, and sponges.
Regulatory Compliance: The device complies with ISO 48-4, ISO 868, ISO 21509, and ASTM D2240 standards, ensuring regulatory transparency.
Design Rationale: The benchtop design is intentional to meet standards such as ISO 48-4, which requires a 250g application for the Shore AM scale, and ASTM D2240, which mandates benchtop support for the Shore M scale.
Technical Specifications: The tester weighs 19 kg and operates on a power supply of 115/230v - 50÷60Hz. It includes a comprehensive kit of accessories for measuring objects with complex geometries.
Additional Information: The product is not covered by accreditation and is subject to technical changes. It is supported by a calibration center compliant with ISO 17025.
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Catalog excerpts

DX 833 - Shore M/AM benchtop hardness tester-1

Shore M/AM benchtop hardness tester

 Open the catalog to page 1
DX 833 - Shore M/AM benchtop hardness tester-2

The DX 833 benchtop hardness tester is intended for performing Shore M and AM scales in a fully controlled manner: the test cycle is in fact electronic and automatic. Suitable for all polymers, elastomers, rubbers and gel-like materials (such as plastics, rubber, medical items, paper and sponges) of small to medium size and complex geometries. What are the immediate benefits? It eliminates human influence in text execution, therefore ensuring greater accuracy of results It maximises the reproducibility of measurements thanks to the electronic control of the probe descent speed, with programmable...

 Open the catalog to page 2

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