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low temperature atomic force microscope

low temperature atomic force microscope

Product catalog summary
Microscope Setup
The attoAFM I is equipped with an ultra-stable AFM head featuring interferometric deflection detection. The cantilever sensor is fixed and stable, ensuring precise adjustments.
Operation Modes
The microscope supports various imaging modes including contact mode, non-contact mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), and Scanning Gate Microscopy (SGM). It utilizes a PI feedback loop with an additional Phase-Locked Loop (PLL) for enhanced performance.
Sample Positioning
Positioning is achieved using ANPxyz101 coarse positioners and ANSxyz100 piezo scanners. The coarse range is 5 x 5 x 5 mm³ with a step size of 0.05 to 3 µm at 300 K and 10 to 500 nm at 4 K. The fine scan range is 40 x 40 µm² at 300 K and 30 x 30 µm² at 4 K. Sample and tip monitoring is facilitated via a CCD camera and mirror.
Operating Conditions
The microscope operates within a temperature range of 1 to 300 K, depending on the cryostat, and a magnetic field range of 0 to 15 T, depending on the magnet. It is designed for an operating pressure range of 1E-6 mbar to 1 bar, suitable for exchange gas atmospheres.
Cooling Specifications
The system is designed for a 2-inch (50.8 mm) cryostat/magnet bore and is compatible with LTSYS -He4 and LTSYS -He3 cryostats.
Probes
The microscope is compatible with standard commercial cantilevers and supports both coated and non-coated probes, including magnetic probes.
Noise
The deflection noise density is less than 0.7 pm/√Hz with a 40 kHz bandwidth. The measured force noise is less than 100 pN with a 1 kHz bandwidth and 0.2 N/m. The z bit resolution is 7.6 pm in full range mode and 0.12 pm in small range mode.
Scan Controller and Software
The ASC500 SPM controller is used for detailed specifications, which can be found in the ASC500 section.
Legal Notice
All rights, including those created by patent grant or registration of a utility model or design, are reserved. Delivery is subject to availability. Designations may be trademarks, and unauthorized use may violate trademark rights. © attocube systems AG 2001-2007.
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low temperature atomic force microscope-1

All rights, including rights created by patent grant or registration of a utility model or design as well as rights of technical modifications are reserved. Delivery subject to availability. Designations may be trademarks, the use of which by third parties for their own purposes may violate the rights of the trademark owners. attocube systems AG 2001-2007. >

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